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    ANSI IEEE C57 19 100-2012 Guide for Application of Power Apparatus Bushings.pdf

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    ANSI IEEE C57 19 100-2012 Guide for Application of Power Apparatus Bushings.pdf

    1、IEEE Guide for Application of Power Apparatus Bushings Sponsored by the Transformers Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 22 February 2013 IEEE Power and Energy Society IEEE Std C57.19-100-2012 (Revision of IEEE Std C57.19-100-1995) IEEE Std C57.19.100TM-2012 (Revision of IEEE St

    2、d C57.19.100-1995) IEEE Guide for Application of Power Apparatus Bushings Sponsor Transformers Committee of the IEEE Power and Energy Society Approved 5 December 2012 IEEE-SA Standards Board Approved 3 November 2014 American National Standards InstituteAbstract: Guidance on the use of outdoor power

    3、apparatus bushings is provided. The bushings are limited to those built in accordance with IEEE Std C57.19.00TM-1991. General information and recommendations for the application of power apparatus bushings when incorporated as part of power transformers, power circuit breakers, and isolated-phase bu

    4、s are provided. Keywords: circuit breakers, IEEE C57.19.100TM, isolated-phase bus, power apparatus bushings, transformers xThe Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers,

    5、Inc. All rights reserved. Published 22 February 2013. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clear

    6、ance Center. iv Copyright 2013 IEEE. All rights reserved. Notice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory re

    7、quirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing s

    8、o. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods.

    9、 By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the is

    10、suance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determi

    11、ne whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE Sta

    12、ndards Association or the IEEE standards development process, visit the IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to c

    13、heck this URL for errata periodically. v Copyright 2013 IEEE. All rights reserved. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with re

    14、spect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website http:/standards.ieee.org/about/sasb/patcom/patents.html.

    15、 Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such li

    16、censes. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whethe

    17、r any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infr

    18、ingement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2013 IEEE. All rights reserved. Participants At the time this guide was submitted to the IEEE-SA Standards Board for approval, the Guide for Applicatio

    19、n of Power Apparatus Bushings Working Group had the following membership: Thomas Spitzer, Chair Jesse Patton, Vice Chair Carlo Arpino Ray Bartnikas Jeffrey Benach Gene Blackburn John Brafa Florian Costa John Crouse Larry Davis Arturo Del Rio Lonnie Elder Fred Elliott Keith Ellis Mary Foster Charles

    20、Garner Joseph Garza John Graham Roger Hayes Chungduck Ko Reiner Krump Mario Locarno Van Nhi Nguyen Leslie Recksiedler Randolph Rensi Devki Sharma Craig Steigemier John Stein Jane Vermer Eric Weatherbee Michael Williams Shibao Zhang Peter Zhao The following members of the individual balloting committ

    21、ee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Mohamed Abdel Khalek Stephen Antosz Carlo Arpino Peter Balma Robert Barnett Barry Beaster Jeffrey Benach W. (Bill) J. Bergman Wallace Binder Thomas Blackburn W. Boettger John Brafa William Bush Arvind K. Chaud

    22、hary Bill Chiu Robert Christman Kurt Clemente Jerry Corkran John Crouse Willaim Darovny Gary Donner Fred Elliott Keith Ellis Gary Engmann James Fairris Jorge Fernandez Daher Patrick Fitzgerald Joseph Foldi Marcel Fortin Robert Ganser Charles Garner Saurabh Ghosh David Giegel David Gilmer Jalal Gohar

    23、i Edwin Goodwin James Graham William Griesacker Randall C. Groves Bal Gupta Charles Hand David Harris Roger Hayes Lee Herron Gary Heuston Gary Hoffman Philip Hopkinson John Kay Gael Kennedy Sheldon Kennedy Joseph L. Koepfinger Jim Kulchisky Saumen Kundu John Lackey Chung-Yiu Lam Hua Liu Albert Livsh

    24、itz Thomas Lundquist Greg Luri Richard Marek J. Dennis Marlow Lee Matthews Andrew McNulty Georges Montillet Jerry Murphy Ryan Musgrove K. R. M. Nair Arthur Neubauer Michael S. Newman Joe Nims Ted Olsen Lorraine Padden Bansi Patel Shawn Patterson Jesse Patton Brian Penny Paul Pillitteri Alvaro Portil

    25、lo Lewis Powell Iulian Profir Reynaldo Ramos Jean-Christophe Riboud Johannes Rickmann John Roach Michael Roberts John Rossetti Marnie Roussell Thomas Rozek Daniel Sauer Bartien Sayogo Devki Sharma Gil Shultz James Smith Jeremy Smith Jerry Smith Brian Sparling Thomas Spitzer Gary Stoedter John Vergis

    26、 Jane Verner Loren Wagenaar David Wallach Barry Ward Joe Watson Eric Weatherbee Peter Werelius Kenneth White Wael Youssef Jian Yu Matthew Zeedyk Shibao Zhang Peter Zhao Xi Zhu Waldemar Ziomek vii Copyright 2013 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this guide on 5 Dece

    27、mber 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert Grow, Past Chair Konstantinos Karachalios, Secretary Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim

    28、Hughes Young Kyun Kim Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Mike Seavey Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Rep

    29、resentative Michael Janezic, NIST Representative Patrick Gibbons IEEE Standards Program Manager, Document Development Erin Spiewak IEEE Standards Program Manager, Technical Program Development viii Copyright 2013 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C57.1

    30、9.100-2012, IEEE Guide for Application of Power Apparatus Bushings. ,Q$XJXVWWKH$16, the second (C76.2, currently IEEE Std C57.19.01TM-1991) was to cover explicit ratings and dimensions; and the third (C76.3) was to be an application guide. This document, IEEE Std C57.19.100-2012, is the application

    31、guide. When the ANS, however, progressive changes in physical properties will occur when excessive temperatures are maintained for long durations. These changes could result in loss of seal and consequent loss of dielectric strength. Therefore, repeated occurrences at high temperature will require i

    32、nspection for oil leaks and corrective actions where necessary. 4.1.2.3 Power factor and capacitance There are many reasons why insulation power factor and/or capacitance may increase over the life of a bushing. In fact, some slight increase of power factor can be tolerated. However, degradation of

    33、that portion of the insulation that operates at greatly elevated temperature could result in a substantial increase in power factor. An unusual increase in power factor may become an indicator of the detrimental mechanical and electrical effects of loading beyond nameplate rating. Bushings that have

    34、 been loaded beyond nameplate rating should be tested more frequently. 4.1.2.4 Dielectric performance at elevated temperatures When bushing insulation is subjected to high electrical stress at above its normal operating temperatures, the insulation power factor increases due to increased dielectric

    35、loss. When the increase in dielectric loss exceeds the ability of the insulation to dissipate this increased loss, the temperature of the dielectric is IEEE Std C57.19.100-2012 IEEE Guide for Application of Power Apparatus Bushings 5 Copyright 2013 IEEE. All rights reserved. further increased. Under

    36、 some extreme conditions, thermal runaway may occur. This risk should be considered when the guide is applied. Special capacitance-graded bushings built with insulation systems such as thermally upgraded paper or resin impregnated paper, rated higher than temperature index 105 insulation class, are

    37、sometimes used. These insulation systems may have higher power factors particularly at higher temperatures and may experiHQFHWKHUPDOUXQDZDLIORDGHGVLJQLFDQWOEHRQGWKHQDPHSODWHUDWLQJ)RUVSHFLFLQIRUPDWLRQthe manufacturer should be contacted. 4.1.2.5 Stray magnetic flux Additional heating may occur in bus

    38、hings placed in the magnetic field of the windings and leads. The heating can result from the eddy current flowing in the metallic portions of the bushing below the mounting flange. The magnetic flux will increase with the load current. Magnetic fields can create high eddy current losses in tanks, f

    39、langes, and bus enclosures during overload conditions, causing them to reach high temperatures. High temperatures of the part itself may not be of concern, but the heat may transfer to the bushing causing high-temperature bushing concerns. 4.2 Temperature calculations for short-time loads above bush

    40、ing rating The hottest-spot temperature of a bushing is of importance when it is loaded under various conditions. The YHNHHOHPHQWVWKDWDIIHFWWKHEXVKLQJKRWWHVWVSRWDUHWKHEXVKLQJFXUUHQWWKHDPELHQWDLUWHPSHUDWXUHthe surrounding oil temperature, the air-end-connection temperature, and the oil-end-connection

    41、 temperature. Easley and McNutt B35gave an expression that contains each of these elements. Accurate information about the end-FRQQHFWLRQ WHPSHUDWXUHV DQG FRHIFLHQWV LV XVXDOO QRW DYDLODEOHTherefore, this guide uses a more conservative method that requires information only about the bushing current,

    42、 the ambient air temperature, and the surrounding oil temperature to calculate the bushing hottest-spot temperature. This method was developed from experimental data for bushings with no appreciable dielectric losses and no cooling ducts. Three constants are determined as described in 4.3.3. These c

    43、onstants are then used to estimate the steady-state and transient bushing hottest-spot temperatures. Mathematical models for bushings with appreciable dielectric losses and/or with cooling ducts may be developed in the future and could be used in the same manner. 4.2.1 Steady-state hottest-spot temp

    44、erature calculations The steady-state temperature rise at the hottest spot of the conductor for bottom connected bushings with no appreciable dielectric losses and no cooling ducts is estimated with Equation (1): HS 1 2 0nKI K4 4 (1) where ,HS is the steady-state bushing hottest-spot rise over ambie

    45、nt (C) ,0 is the steady-state immersion oil rise over ambient (C) (transformer top oil rise) 5The numbers in brackets correspond to those of the bibliography in Annex B. IEEE Std C57.19.100-2012 IEEE Guide for Application of Power Apparatus Bushings 6 Copyright 2013 IEEE. All rights reserved. I is t

    46、he per unit load current based on bushing rating n, K1, and K2are constants that can be determined as described in 4.3 Typical values of K1range from 15 to 32. Typical values of K2range from 0.6 to 0.8. The exponent n generally ranges between 1.6 and 2.0, with 1.8 being the most common value. When a

    47、 bushing is operated in the draw-lead mode, the thermal performance is dominated by an integral part of the transformer that is inserted through the tube of the bushing. This lead is not an integral part of the bushing, so the thermal performance caQQRWEHGLUHFWOUHODWHGWRDVSHFLFGHVLJQRIEXVKLQJWKDWPDa

    48、lso be operated in other transformers with different size draw leads. The temperature of the hottest spot of the conductor, when operated in the draw-lead mode, may be determined in the same manner, with I being the per unit load current of the draw lead. 4.2.2 Transient hottest-spot temperature calculations After changes in load current or ambient temperature occur, both the immersion oil temperature


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