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    IEC 62739-1-2013 Test method for erosion of wave soldering equipment using molten lead-free solder alloy - Part 1 Erosion test method for metal materials withou.pdf

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    IEC 62739-1-2013 Test method for erosion of wave soldering equipment using molten lead-free solder alloy - Part 1 Erosion test method for metal materials withou.pdf

    1、 IEC 62739-1 Edition 1.0 2013-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Test method for erosion of wave soldering equipment using molten lead-free solder alloy Part 1: Erosion test method for metal materials without surface processing Mthode dessai de lrosion de lquipement de brasage la vague u

    2、tilisant un alliage braser sans plomb fondu Partie 1: Mthode dessai drosion de matriaux mtalliques sans traitement de surface IEC62739-1:2013 colourinsideTHIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2013 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this p

    3、ublication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have

    4、 an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous

    5、 quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaire

    6、s sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotec

    7、hnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you

    8、 have the latest edition, a corrigenda or an amendment might have been published. Useful links: IEC publications search - www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information o

    9、n projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds lead

    10、ing online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If

    11、 you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour t

    12、out ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles

    13、: Recherche de publications CEI - www.iec.ch/searchpub La recherche avance vous permet de trouver des publications CEI en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. Just Published C

    14、EI - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications de la CEI. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectr

    15、oniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donne

    16、r des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 62739-1 Edition 1.0 2013-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Test method for erosion of wave soldering equipment using molten lead-free solder alloy Part 1: Erosion test method for metal

    17、materials without surface processing Mthode dessai de lrosion de lquipement de brasage la vague utilisant un alliage braser sans plomb fondu Partie 1: Mthode dessai drosion de matriaux mtalliques sans traitement de surface INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNA

    18、TIONALE R ICS 31.190; 31.240 PRICE CODE CODE PRIX ISBN 978-2-83220-870-0 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention

    19、! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colourinside 2 62739-1 IEC:2013 CONTENTS FOREWORD . 3 1 Scope . 5 2 Normative references . 5 3 Terms and definitions . 5 4 Test 6 4.1 Overview . 6 4.2 Test equipment . 6 4.2.1 Test equipment description 6 4.2.2 C

    20、onfiguration example of test equipment 6 4.3 Specimen 7 4.4 Test conditions 9 4.5 Test method 9 4.5.1 Test procedure 9 4.5.2 Dross removal procedure . 10 5 Method of erosion depth measurement (focal depth method with optical microscope) 10 5.1 General . 10 5.2 Preparation of the specimen 10 5.3 Meas

    21、urement equipment . 10 5.4 Measurement procedure 11 6 Items to be recorded in test report 12 Annex A (normative) Specifications of test equipment any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental

    22、 organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on techn

    23、ical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IE

    24、C National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international unifor

    25、mity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) I

    26、EC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure

    27、 that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any

    28、 nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the refer

    29、enced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. Intern

    30、ational Standard IEC 62739-1 has been prepared by IEC technical committee 91: Electronics assembly technology. The text of this standard is based on the following documents: FDIS Report on voting 91/1092/FDIS 91/1106/RVD Full information on the voting for the approval of this standard can be found i

    31、n the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 4 62739-1 IEC:2013 A list of all parts in the IEC 62739 series, published under the general title Test method for erosion of wave soldering equipment using molten

    32、 lead-free solder alloy, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publ

    33、ication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print t

    34、his document using a colour printer. 62739-1 IEC:2013 5 TEST METHOD FOR EROSION OF WAVE SOLDERING EQUIPMENT USING MOLTEN LEAD-FREE SOLDER ALLOY Part 1: Erosion test method for metal materials without surface processing 1 Scope This part of the IEC 62739 series provides an evaluating test method for

    35、the erosion of the metallic materials without surface processing intended to be used for lead-free wave soldering equipment as a solder bath and other components which are in contact with the molten solder. 2 Normative references The following documents, in whole or in part, are normatively referenc

    36、ed in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61190-1-3, Attachment materials for electronic assembly Part 1-3: Require

    37、ments for electronic grade solder alloys and fluxed and non-fluxed solid solder for electronic soldering applications IEC 60068-2-20:2008, Environmental testing Part 2-20: Tests Test T: Test methods for solderability and resistance to soldering heat of devices with leads 3 Terms and definitions For

    38、the purposes of this document, the following terms and definitions apply. 3.1 erosion phenomenon where a base material is dissolved and made thinner by coming into contact with molten solder 3.2 lead-free solder alloy that does not contain more than 0,1 % mass fraction of lead (Pb) as its constituen

    39、t and is used for joining components to substrates or for coating surfaces SOURCE: IEC 60194:2006, 75.1904 modified “mass fraction“ is used instead of “weight“ 3.3 dross oxide and other contaminants that form on the surface of molten solder SOURCE: IEC 60194:2006, 75.0410 6 62739-1 IEC:2013 4 Test 4

    40、.1 Overview The specimen is mounted to the rotation block of the test equipment which is driven by the motor (may include gear unit) then immersed into molten lead-free solder and rotated to simulate solder flow in the wave soldering equipment. The erosion depth is measured after the block is rotate

    41、d for a designated period of time. 4.2 Test equipment 4.2.1 Test equipment description Test equipment shall include equipment that realises the test conditions specified in 4.3. Component materials of the test equipment which come in contact with molten solder shall be erosion resistant or processed

    42、 to be erosion resistant. Details of the specifications of the equipment are given in Annex A. 4.2.2 Configuration example of test equipment An example of the configuration of the test equipment is shown in Figure 1. The test equipment consists of a pot unit, rotation unit, and control unit. a) The

    43、pot unit consists of a heater to melt the lead-free solder alloy and a pot in which a specimen can rotate. b) The rotation unit consists of a motor which rotates the specimen and a rotation block to which the specimen is attached. c) The control unit has functions to control the heater, using a temp

    44、erature sensor, control mechanism and motor rotation. Since dross spreads during the test, it is preferable for the test equipment to have a ventilatory function with an exhaust air duct. Other test equipment can be used if its configuration and functions meet the above requirements. 62739-1 IEC:201

    45、3 7 Control unit Rotation motor Pot unit Specimen Solder Exhaust air duct Pot Heater Rotation unit Temperature sensor Rotation block IEC 1429/13 Figure 1 Configuration example of test equipment 4.3 Specimen A specimen of the following material and shape is used. a) The material of the specimen shall

    46、 be the same as that of the solder bath and its components which come into contact with the molten solder. b) The shape of specimen and the indication of the material designation shall be as shown in Figure 2. The indication of the material designation shall be engraved. c) The surfaces of the speci

    47、men to be evaluated shall be the surface with material indication (face A) and its backside (face B), and from the lower edge to 50 mm above it. 8 62739-1 IEC:2013 Dimensions in millimetres 2 8 4 2 3,3 86105701 IEC 1430/13 Key 1 Laser engraved mark Figure 2 Shape of the specimen 62739-1 IEC:2013 9 4

    48、.4 Test conditions Test materials and test conditions are shown in Table 1. Table 1 Test conditions Composition of test solder alloy Sn96,5Ag3Cu,5 specified in IEC 61190-1-3 shall be used if not otherwise specified in individual standards. Test flux Rosin flux with halide content of 0,2 % mass fract

    49、ion shall be used. Materials specified in Annex B of IEC 60068-2-20:2008, shall be used. Solder temperature (at measurement position) 350 C 3 C (the temperature is measured at a depth of 35 mm to 40 mm from the solder surface and at a distance of 20 mm to 30 mm from the specimen.). Rotation speed of specimen 100 r/min 3 r/min Rotation radius of specimen 6 mm to 8 mm (from the centre of the rotation


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