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    IEC 62433-3-2017 EMC IC modelling - Part 3 Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)《电磁兼容性集成电(EMC IC.pdf

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    IEC 62433-3-2017 EMC IC modelling - Part 3 Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)《电磁兼容性集成电(EMC IC.pdf

    1、 IEC 62433-3 Edition 1.0 2017-01 INTERNATIONAL STANDARD NORME INTERNATIONALE EMC IC modelling Part 3: Models of integrated circuits for EMI behavioural simulation Radiated emissions modelling (ICEM-RE) Modles de circuits intgrs pour la CEM Partie 3: Modles de circuits intgrs pour la simulation du co

    2、mportement lors de perturbations lectromagntiques Modlisation des missions rayonnes (ICEM-RE) IEC 62433-3:2017-01(en-fr) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2017 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be r

    3、eproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about o

    4、btaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que

    5、ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de lIEC ou du Comit national de lIEC du pays du demandeur. Si vous avez des questions sur le copyright de lIEC ou si vous dsirez obtenir des droits supplmentaires sur cette publication,

    6、utilisez les coordonnes ci-aprs ou contactez le Comit national de lIEC de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is

    7、the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a

    8、 corrigenda or an amendment might have been published. IEC Catalogue - webstore.iec.ch/catalogue The stand-alone application for consulting the entire bibliographical information on IEC International Standards, Technical Specifications, Technical Reports and other documents. Available for PC, Mac OS

    9、, Android Tablets and iPad. IEC publications search - www.iec.ch/searchpub The advanced search enables to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - we

    10、bstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available online and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing 20 00

    11、0 terms and definitions in English and French, with equivalent terms in 16 additional languages. Also known as the International Electrotechnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary 65 000 electrotechnical terminology entries in English and French extracted from the Terms and

    12、 Definitions clause of IEC publications issued since 2002. Some entries have been collected from earlier publications of IEC TC 37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact

    13、the Customer Service Centre: csciec.ch. A propos de lIEC La Commission Electrotechnique Internationale (IEC) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publication

    14、s IEC Le contenu technique des publications IEC est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue IEC - webstore.iec.ch/catalogue Application autonome pour consulter tous les renseignements bibliographiques

    15、 sur les Normes internationales, Spcifications techniques, Rapports techniques et autres documents de lIEC. Disponible pour PC, Mac OS, tablettes Android et iPad. Recherche de publications IEC - www.iec.ch/searchpub La recherche avance permet de trouver des publications IEC en utilisant diffrents cr

    16、itres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. IEC Just Published - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications IEC. Just Published dtaille les nouvelles publications parues. D

    17、isponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne de termes lectroniques et lectriques. Il contient 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans 16 langues additionnelles. Egalem

    18、ent appel Vocabulaire Electrotechnique International (IEV) en ligne. Glossaire IEC - std.iec.ch/glossary 65 000 entres terminologiques lectrotechniques, en anglais et en franais, extraites des articles Termes et Dfinitions des publications IEC parues depuis 2002. Plus certaines entres antrieures ext

    19、raites des publications des CE 37, 77, 86 et CISPR de lIEC. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 62433-3 Edition 1.0 2017-01 INTERNATIONAL STANDARD NORME INTERNATIONALE EMC

    20、 IC modelling Part 3: Models of integrated circuits for EMI behavioural simulation Radiated emissions modelling (ICEM-RE) Modles de circuits intgrs pour la CEM Partie 3: Modles de circuits intgrs pour la simulation du comportement lors de perturbations lectromagntiques Modlisation des missions rayon

    21、nes (ICEM-RE) INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE 31.200; 33.100.10 ISBN 978-2-8322-3878-3 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you

    22、obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour inside 2 IEC 62433-3:2017 IEC 2017 CONTENTS FOREWORD . 6 1 Scope 8 2 Normative references 8 3 Terms, definitions, abbreviations and conven

    23、tions . 9 3.1 Terms and definitions 9 3.2 Abbreviations 10 3.3 Conventions 10 4 Philosophy . 10 5 ICEM-RE macro-model description 11 5.1 General . 11 5.2 PDN description 12 5.3 IA description 16 5.4 Electromagnetic field calculation and simulation . 16 6 REML format . 17 6.1 General . 17 6.2 REML st

    24、ructure . 18 6.3 Global keywords . 19 6.4 Header section 19 6.5 Frequency definitions 20 6.6 Coordinate system definition . 20 6.7 Reference definition 21 6.8 Validity section . 21 6.8.1 General . 21 6.8.2 Attribute definitions 22 6.9 PDN 24 6.9.1 General . 24 6.9.2 Attribute definitions 25 6.9.3 PD

    25、N of a single-frequency ICEM-RE 26 6.9.4 PDN for multi-frequency ICEM-RE . 29 6.10 IA 32 6.10.1 General . 32 6.10.2 Attribute definitions 33 6.10.3 IA of a single-frequency ICEM-RE . 34 6.10.4 IA for multi-frequency ICEM-RE . 37 7 Extraction 38 7.1 General . 38 7.2 Environmental extraction constrain

    26、ts . 39 7.3 Obtaining model parameters from near-field data 39 7.3.1 General . 39 7.3.2 PDN 40 7.3.3 IA 42 7.4 Extraction based on ICEM-CE simulation 45 7.4.1 General . 45 7.4.2 PDN 45 7.4.3 IA 46 8 Validation 46 IEC 62433-3:2017 IEC 2017 3 Annex A (normative) Preliminary definitions for XML represe

    27、ntation 48 A.1 XML basics . 48 A.1.1 XML declaration . 48 A.1.2 Basic elements 48 A.1.3 Root element . 48 A.1.4 Comments . 48 A.1.5 Line terminations . 49 A.1.6 Element hierarchy 49 A.1.7 Element attributes . 49 A.2 Keyword requirements 49 A.2.1 General . 49 A.2.2 Keyword characters . 49 A.2.3 Keywo

    28、rd syntax . 50 A.2.4 File structure . 50 A.2.5 Values . 52 Annex B (informative) Electromagnetic fields radiated by an elementary electric and magnetic dipole 55 B.1 Electric dipole . 55 B.2 Magnetic dipole. 57 Annex C (informative) Example files 60 C.1 Minimum default ICEM-RE file 60 C.2 Microcontr

    29、oller example in REML format . 61 Annex D (normative) REML valid keywords and usage . 63 D.1 Root element keywords . 63 D.2 File header keywords 64 D.3 Validity section keywords 65 D.4 Global keywords . 65 D.5 Pdn section keywords . 66 D.6 Ia section keywords 67 Annex E (informative) ICEM-RE extract

    30、ion methods 69 E.1 General . 69 E.2 ICEM-RE Modelling methods 69 E.2.1 Model Hman. 69 E.2.2 Model H69 E.2.3 Model EM_Inv. 71 E.2.4 Model EM_Iter72 E.2.5 Model EM_TD. 72 E.2.6 Model selection guide 73 E.3 ICEM-RE modelling environment from near-field data . 73 E.3.1 General . 73 E.3.2 Modelling desig

    31、n-flow 74 E.3.3 ICEM-RE importation into 3D electromagnetic tools . 75 E.4 ICEM-RE modelling from ICEM-CE . 76 Annex F (informative) ICEM-RE model validation examples . 78 F.1 General . 78 F.2 Validation on a microcontroller 78 F.2.1 General . 78 F.2.2 Details of the microcontroller . 78 4 IEC 62433

    32、-3:2017 IEC 2017 F.2.3 Case 1: Choosing manual model Model Hman78 F.2.4 Case 2: Choosing one of the automatic magnetic field models . 79 F.3 Validation on an oscillator circuit . 81 F.4 Example of validation on passive devices . 84 F.5 Examples of validation on active devices 85 F.5.1 Extraction fro

    33、m near-field measurements . 85 F.5.2 Extraction from ICEM-CE model 85 Annex G (informative) ICEM-RE macro-model usage examples . 86 G.1 General . 86 G.2 Methodology for exploiting ICEM-RE macro-model 86 Bibliography 88 Figure 1 General ICEM-RE model structure 12 Figure 2 Geometrical representation o

    34、f the ICEM-RE PDN . 13 Figure 3 Representation of an elementary dipole in the ICEM-RE PDN 13 Figure 4 An elementary current loop of radius “a” in 3D space . 14 Figure 5 Duality theorem between a current loop and a magnetic dipole 14 Figure 6 Example of referential points to describe the geometry 15

    35、Figure 7 PDN definition at three different frequencies 16 Figure 8 REML inheritance hierarchy . 18 Figure 9 Format for defining PDN vector data in an external file . 28 Figure 10 Format for defining IA vector data in an external file . 36 Figure 11 Electromagnetic field measurement 39 Figure 12 B zf

    36、ield in nT measured at 3 mm above the microprocessor at 80 MHz. 40 Figure 13 Example of electromagnetic field emitted by an elementary current line . 41 Figure 14 Manual current mapping . 41 Figure 15 Model representation with N automatically detected dipoles . 42 Figure 16 Comparison between the mo

    37、delled and measured EM fields at 2 mm above an oscillator 44 Figure 17 A simple ICEM-CE PDN representing the package and the internal network impedance between the power rails . 45 Figure 18 Reconstructing the geometry of the package model (ICEM-RE PDN) from IBIS and its link with the electrical mod

    38、el (ICEM-CE PDN) 46 Figure 19 Graphical representation of the example validation procedure 47 Figure A.1 Multiple XML files . 51 Figure A.2 XML files with data files (*.dat) . 51 Figure A.3 XML files with additional files 52 Figure B.1 An elementary current line in space 55 Figure B.2 Elementary mag

    39、netic dipole in space 57 Figure C.1 Microcontroller used for illustration . 61 Figure C.2 Data file representing the PDN information of the microcontroller . 62 Figure C.3 Data file representing the IA information of the microcontroller . 62 Figure E.1 Manually defined electric dipole array in Model

    40、 Hman69 Figure E.2 Electric and magnetic dipole array in Model EM_Inv71 Figure E.3 Example of an ICEM-RE modelling environment . 74 IEC 62433-3:2017 IEC 2017 5 Figure E.4 ICEM-RE modelling design-flow 75 Figure E.5 Example of an imported ICEM-RE PDN and IA in a 3D simulation tool 76 Figure E.6 Desig

    41、n-flow to obtain ICEM-RE from ICEM-CE model . 77 Figure F.1 Microcontroller circuit used for model validation 78 Figure F.2 Manual dipoles representing the PDN of the microcontroller . 79 Figure F.3 Comparison between the modelled and measured fields at 4 mm above the microcontroller using Model Hma

    42、n. 79 Figure F.4 Validation of Model Hon the microcontroller 80 Figure F.5 Detection of dipoles representing the microcontroller using Model EM_Iter80 Figure F.6 Validation of Model EM_Iteron the microcontroller 81 Figure F.7 Oscillator circuit used for model validation 81 Figure F.8 Schematic of th

    43、e oscillator used for validation . 82 Figure F.9 Validation of the magnetic field predicted with Model EM_Invand Model EM_Iteron the oscillator at 10 mm height 83 Figure F.10 Validation of the electric field predicted with Model EM_Invand Model EM_Iteron the oscillator at 10 mm height 83 Figure F.11

    44、 Modelled maximum total magnetic field as a function of height (z) above the oscillator compared with measurements 84 Figure G.1 Typical EMC issues at equipment and system level covered by ICEM-RE . 87 Table 1 PDN format . 15 Table 2 Definition of the Validity section 22 Table 3 Definition of the Su

    45、bmodel section of the Pdn element 25 Table 4 Definition of the Vector keyword in the Pdn section . 25 Table 5 Valid fields of the Submodel keyword for single-frequency PDN 27 Table 6 Conditions for correct annotation of single-frequency PDN by the REM parser . 27 Table 7 Valid fields of the Vector k

    46、eyword for single-frequency PDN 27 Table 8 Valid file extensions in the Pdn section . 29 Table 9 Conditions for correct annotation of multi-frequency PDN by the REM parser 30 Table 10 Definition of the Submodel section of the Ia element . 32 Table 11 Definition of the Vector keyword in the Ia sectio

    47、n 33 Table 12 Valid fields of the Submodel keyword for single-frequency IA 34 Table 13 Conditions for correct annotation of single-frequency IA by the REM parser 34 Table 14 Valid fields of the Vector keyword for single-frequency IA 35 Table 15 Accepted file extensions in the Ia section 37 Table 16

    48、Conditions for correct annotation of multi-frequency IA by the REM parser . 37 Table A.1 Valid logarithmic units 53 Table E.1 ICEM-RE model selection guide . 73 Table F.1 ICEM-RE model validation on passive structures 85 6 IEC 62433-3:2017 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ EMC IC MODELLING Part 3: Models of integrated circuits for EMI behavioural simulation Radiated emissions modelling (ICEM-RE) FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Com


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