1、 IEC 62220-1-1 Edition 1.0 2015-03 INTERNATIONAL STANDARD NORME INTERNATIONALE Medical electrical equipment Characteristics of digital X-ray imaging devices Part 1-1: Determination of the detective quantum efficiency Detectors used in radiographic imaging Appareils lectromdicaux Caractristiques des
2、dispositifs dimagerie rayonnement X Partie 1-1: Dtermination de lefficacit quantique de dtection Dtecteurs utiliss en imagerie radiographique IEC 62220-1-1:2015-03(en-fr) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2015 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified,
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20、20-1-1 Edition 1.0 2015-03 INTERNATIONAL STANDARD NORME INTERNATIONALE Medical electrical equipment Characteristics of digital X-ray imaging devices Part 1-1: Determination of the detective quantum efficiency Detectors used in radiographic imaging Appareils lectromdicaux Caractristiques des disposit
21、ifs dimagerie rayonnement X Partie 1-1: Dtermination de lefficacit quantique de dtection Dtecteurs utiliss en imagerie radiographique INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 11.040.50 ISBN 978-2-8322-2389-5 Registered trademark of the International El
22、ectrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 IEC 62220-1-1:2015 IEC 2015
23、 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative references 7 3 Terms and definitions 8 4 Requirements 10 Operating conditions . 10 4.1X-RAY EQUIPMENT . 10 4.2RADIATION QUALITY . 10 4.3TEST DEVICE 11 4.4Geometry 12 4.5IRRADIATION conditions 14 4.6 4.6.1 General conditions . 14 4.6.2 AIR
24、 KERMA measurement 15 4.6.3 Avoidance of LAG EFFECTS 16 4.6.4 IRRADIATION to obtain the CONVERSION FUNCTION. 16 4.6.5 IRRADIATION for determination of the NOISE POWER SPECTRUM 16 4.6.6 IRRADIATION for determination of the MODULATION TRANSFER FUNCTION 17 4.6.7 Overview of all necessary IRRADIATIONS .
25、 18 5 Corrections of RAW DATA 18 6 Determination of the DETECTIVE QUANTUM EFFICIENCY 19 Definition and formula of DQE(u,v) 19 6.1Parameters to be used for evaluation 19 6.2Determination of different parameters from the images . 20 6.3 6.3.1 Linearization of data 20 6.3.2 The NOISE POWER SPECTRUM (NP
26、S) . 20 6.3.3 Determination of the MODULATION TRANSFER FUNCTION (MTF) 22 7 Format of conformance statement . 24 8 Accuracy . 25 Annex A (normative) Determination of LAG EFFECTS 26 A.1 Overview. 26 A.2 Estimation of LAG EFFECTS (default method) 26 A.3 Estimation of LAG EFFECTS, alternative method (on
27、ly if no LAG EFFECT or ghosting compensation is applied) 26 General . 26 A.3.1Test of additive LAG EFFECTS 27 A.3.2Test of multiplicative LAG EFFECTS 29 A.3.3Determination of the minimum time between consecutive images 31 A.3.4 Annex B (informative) Calculation of the input NOISE POWER SPECTRUM. 32
28、Bibliography 33 Index of defined terms used in this particular standard 36 Figure 1 TEST DEVICE for the determination of the MODULATION TRANSFER FUNCTION and the magnitude of LAG EFFECTS 12 IEC 62220-1-1:2015 IEC 2015 3 Figure 2 Geometry for exposing the DIGITAL X-RAY IMAGING DEVICE behind the TEST
29、DEVICE in order to determine LAG EFFECTS and the MODULATION TRANSFER FUNCTION 14 Figure 3 Position of the TEST DEVICE for the determination of the MODULATION TRANSFER FUNCTION . 17 Figure 4 Geometric arrangement of the ROIs for NPS calculation 21 Figure 5 Representation of the image acquired for the
30、 determination of the MTF . 23 Figure A.1 Definition of the ROIs for the test of additive LAG EFFECTS . 28 Figure A.2 Procedure flow diagram for the test of additive LAG EFFECTS . 28 Figure A.3 Definition of the ROIs for the test of the multiplicative LAG EFFECTS . 30 Figure A.4 Procedure flow diagr
31、am for the test of multiplicative LAG EFFECTS . 30 Table 1 RADIATION QUALITY (IEC 61267:2005) for the determination of DETECTIVE QUANTUM EFFICIENCY and corresponding parameters . 11 Table 2 Necessary IRRADIATIONS 18 Table 3 Parameters mandatory for the application of this standard 20 4 IEC 62220-1-1
32、:2015 IEC 2015 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEDICAL ELECTRICAL EQUIPMENT CHARACTERISTICS OF DIGITAL X-RAY IMAGING DEVICES Part 1-1: Determination of the detective quantum efficiency Detectors used in radiographic imaging FOREWORD 1) The International Electrotechnical Commission (IEC)
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43、e subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62220-1-1 has been prepared by subcommittee 62B: Diagnostic imaging equipment, of IEC technical committee 62: Electrical equipment in medical practice. This first e
44、dition of IEC 62220-1-1 cancels and replaces IEC 62220-1:2003. It constitutes a technical revision of IEC 62220-1:2003 and assures a better alignment with the other parts of the IEC 62220 series. The main changes are as follows: necessary modifications have been applied as a consequence of taking in
45、to account IEC 61267:2005. This influences HVL values and SNR in 2; the method for the determination of LAG EFFECTS now considers lag and ghosting compensation; as part of the MTF determination, the method of obtaining the final averaged MTF has been restricted (only averaging of the ESF is allowed)
46、; IEC 62220-1-1:2015 IEC 2015 5 a description of (optionally) obtaining the diagonal (45) MTF and NPS has been added. The text of this standard is based on the following documents: FDIS Report on voting 62B/968/FDIS 62B/974/RVD Full information on the voting for the approval of this standard can be
47、found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 62220 series, published under the general title Medical electrical equipment Characteristics of digital X-ray imaging device
48、s, can be found on the IEC website. In this standard, terms printed in SMALL CAPITALS are used as defined in IEC 60788, in Clause 3 of this standard or in other IEC publications referenced in the Index of defined terms. Where a defined term is used as a qualifier in another defined or undefined term
49、, it is not printed in SMALL CAPITALS, unless the concept thus qualified is defined or recognized as a “derived term without definition”. NOTE Attention is drawn to the fact that, in cases where the concept addressed is not strongly confined to the definition given in one of the publications listed above, a corresponding term is printed in lower-case letters. In this standard, certai