1、 IEC 61788-17 Edition 1.0 2013-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Superconductivity Part 17: Electronic characteristic measurements Local critical current density and its distribution in large-area superconducting films Supraconductivit Partie 17: Mesures de caractristiques lectroniques
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16、cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 61788-17 Edition 1.0 2013-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Superconductivity Part 17: Electronic characteristic measurements Local critical current density and its distribution in large-area superconducting
17、films Supraconductivit Partie 17: Mesures de caractristiques lectroniques Densit de courant critique local et sa distribution dans les films supraconducteurs de grande surface INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE X ICS 17.220.20; 29.050 PRICE CODE CODE
18、 PRIX ISBN 978-2-83220-583-9 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu
19、 cette publication via un distributeur agr. colourinside 2 61788-17 IEC:2013 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope . 8 2 Normative reference . 8 3 Terms and definitions . 8 4 Requirements . 9 5 Apparatus . 9 5.1 Measurement equipment . 9 5.2 Components for inductive measurements 10 5.2.1 Co
20、ils 10 5.2.2 Spacer film 11 5.2.3 Mechanism for the set-up of the coil 11 5.2.4 Calibration wafer . 11 6 Measurement procedure . 12 6.1 General . 12 6.2 Determination of the experimental coil coefficient 12 6.2.1 Calculation of the theoretical coil coefficient k . 12 6.2.2 Transport measurements of
21、bridges in the calibration wafer 13 6.2.3 U3measurements of the calibration wafer . 13 6.2.4 Calculation of the E-J characteristics from frequency-dependent Ithdata . 13 6.2.5 Determination of the k from Jctand Jc0values for an appropriate E 14 6.3 Measurement of Jcin sample films 15 6.4 Measurement
22、 of Jcwith only one frequency . 15 6.5 Examples of the theoretical and experimental coil coefficients . 16 7 Uncertainty in the test method 17 7.1 Major sources of systematic effects that affect the U3measurement . 17 7.2 Effect of deviation from the prescribed value in the coil-to-film distance 18
23、7.3 Uncertainty of the experimental coil coefficient and the obtained Jc. 18 7.4 Effects of the film edge 19 7.5 Specimen protection 19 8 Test report 19 8.1 Identification of test specimen . 19 8.2 Report of Jcvalues 19 8.3 Report of test conditions 19 Annex A (informative) Additional information re
24、lating to Clauses 1 to 8 20 Annex B (informative) Optional measurement systems . 26 Annex C (informative) Uncertainty considerations 32 Annex D (informative) Evaluation of the uncertainty . 37 Bibliography 43 Figure 1 Diagram for an electric circuit used for inductive Jcmeasurement of HTS films 10 F
25、igure 2 Illustration showing techniques to press the sample coil to HTS films . 11 Figure 3 Example of a calibration wafer used to determine the coil coefficient . 12 61788-17 IEC:2013 3 Figure 4 Illustration for the sample coil and the magnetic field during measurement . 13 Figure 5 E-J characteris
26、tics measured by a transport method and the U3inductive method . 14 Figure 6 Example of the normalized third-harmonic voltages (U3/fI0) measured with various frequencies . 15 Figure 7 Illustration for coils 1 and 3 in Table 1 16 Figure 8 The coil-factor function F(r) = 2H0/I0calculated for the three
27、 coils 17 Figure 9 The coil-to-film distance Z1dependence of the theoretical coil coefficient k 18 Figure A.1 Illustration for the sample coil and the magnetic field during measurement . 22 Figure A.2 (a) U3and (b) U3/I0plotted against I0in a YBCO thin film measured in applied DC magnetic fields, an
28、d the scaling observed when normalized by Ith (insets) 23 Figure B.1 Schematic diagram for the variable-RL-cancel circuit 27 Figure B.2 Diagram for an electrical circuit used for the 2-coil method . 27 Figure B.3 Harmonic noises arising from the power source 28 Figure B.4 Noise reduction using a can
29、cel coil with a superconducting film 28 Figure B.5 Normalized harmonic noises (U3/fI0) arising from the power source . 29 Figure B.6 Normalized noise voltages after the reduction using a cancel coil with a superconducting film . 29 Figure B.7 Normalized noise voltages after the reduction using a can
30、cel coil without a superconducting film 30 Figure B.8 Normalized noise voltages with the 2-coil system shown in Figure B.2 . 30 Figure D.1 Effect of the coil position against a superconducting thin film on the measured Jcvalues 41 Table 1 Specifications and coil coefficients of typical sample coils
31、. 16 Table C.1 Output signals from two nominally identical extensometers 33 Table C.2 Mean values of two output signals . 33 Table C.3 Experimental standard deviations of two output signals . 33 Table C.4 Standard uncertainties of two output signals 34 Table C.5 Coefficient of variations of two outp
32、ut signals 34 Table D.1 Uncertainty budget table for the experimental coil coefficient k . 37 Table D.2 Examples of repeated measurements of Jcand n-values . 40 4 61788-17 IEC:2013 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SUPERCONDUCTIVITY Part 17: Electronic characteristic measurements Local cri
33、tical current density and its distribution in large-area superconducting films FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promot
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43、 correct application of this publication. International Standard IEC 61788-17 has been prepared by IEC technical committee 90: Superconductivity. The text of this standard is based on the following documents: FDIS Report on voting 90/310/FDIS 90/319/RVD Full information on the voting for the approva
44、l of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all the parts of the IEC 61788 series, published under the general title Superconductivity, can be found on the IEC web
45、site. 61788-17 IEC:2013 5 The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, wit
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47、ter. 6 61788-17 IEC:2013 INTRODUCTION Over twenty years after their discovery in 1986, high-temperature superconductors are now finding their way into products and technologies that will revolutionize information transmission, transportation, and energy. Among them, high-temperature superconducting
48、(HTS) microwave filters, which exploit the extremely low surface resistance of superconductors, have already been commercialized. They have two major advantages over conventional non-superconducting filters, namely: low insertion loss (low noise characteristics) and high frequency selectivity (sharp
49、 cut) 11. These advantages enable a reduced number of base stations, improved speech quality, more efficient use of frequency bandwidths, and reduced unnecessary radio wave noise. Large-area superconducting thin films have been developed for use in microwave devices 2. They are also used for emerging superconducting power devices, such as, resistive-type superconducting fault-curr
