1、= 4844891 0573948 320 NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 I EC 1241 -2-1 Premire dition First edition 1994-1 2 Matriels lectriques destins - la CE1 417: Symboles graphiques utilisables sur le matriel. Index. relev et compilation des feuilles individirelles: - ia CE1 617: Syniboies graphi
2、ques polir schmas; et pour les appareils lectromdicaux. - lectriques en prariqite mdicale. la CE1 878: Symboles graphiques pour quipenienrs Les symboles et signes contenus dans la prksente publi- cation ont t soit tirs de la CE1 27, de la CE1 417, de la CE1 617 et/ou de la CE1 878. soit spcifiquemen
3、t approuvs aux fins de cette publication. Publications de la CE1 tablies par le mme comit dtudes Lattention du lecteur est attire sur les listes figurant 21 la fin de cette publication. qui numrent les publications de la CE1 prpares par le comite dtudes qui a tabli la presente publication. Validity
4、of this publication The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information relating to the date of the reconfirmation of the publication is available from the IEC Central Office. Information on the r
5、evision work, the issue of revised editions and amendments may be obtained from IEC National Committees and from the following IEC sources: IEC Bulletin IEC Yearbook Catalogue of IEC publications Published yearly Published yearly with regular updates Terminology For general terminology, readers are
6、referred to IEC 50: International Electrotechnical Vocabulary (IEV), which is issued in the form of separate chapters each dealing with a specific field. Full details of the IEV will be supplied on request. See also the IEC Multilingual Dictionary. The terms and definitions contained in the present
7、publi- cation have either been taken from the IEV or have been specifically approved for the purpose of this publication. Graphical and letter symbols For graphical symbols, and letter symbols and signs approved by the IEC for general use, readers are referred to publications: - IEC 27: Letrer symbo
8、ls to be used in electrical technology; - IEC 417: Graphical symbols for use on equip- ment. Index, survey and compilation of the single sheets; - IEC 617: Graphical symbols for diagrams; and for medical electrical equipment, - equipment in medical practice. IEC 878: Graphical symbols for eiectromed
9、ical The symbols and signs contained in the present publi- cation have either been taken from IEC 27, IEC 417, IEC 617 and/or IEC 878, or have been specifically appro- ved for the purpose of this publication. IEC publications prepared by the same technical committee The attention of readers is drawn
10、 to the end pages of this publication which list the IEC publications issued by the technical committee which has prepared the present publication. Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without
11、license from IHS-,-,-= 4844893 0573950 T89 NORME CE1 INTERNATIONALE IEC INTERNATIONAL STANDARD 1241 =2-1 Premire dition First edition 1994-1 2 Matriels lectriques destins tre utiliss en prsence de poussires combustibles - Partie 2: Mthodes dessai - Section 1 : Mthodes de dtermination de la tempratur
12、e minimale dinflammation de la poussire Electrical apparatus for use in the presence of combustible dust - Part 2: Test methods - Section 1 : Methods for determining the minimum ignition temperatures of dust 0 CE1 1994 Droits de reproduction rservs - Copyright - all rights resewed Aucune parim da it
13、e publication ne put are nproduite ni utilise sous quelque fm que SMt a par awn pro- cM4. hronque ou mcanique. y oompm, la phdocope et les mcrofilms. sans laccord Bait de lditeur No pai( ci this publication may be reproduesd or ulued in any fwm or by any means. elecwir or mechanical. including photo
14、cwying rnd micrdih. Whout pmrmrsion m wntling from the piblsher Bureau Centrai de la Commission Electrotedinique Internationale 3, rue de Varemb6 Geneve. Suisse Commission Electrotechnique Internationale CODE PRIX International Eleclrotechnical Commission PRICE CODE v Mewawaponnan 3newrporexmecnan H
15、OMMCCUR Pourprix. voir catalogue en vigueur For price. see currenf cafabgue Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- m 4844891 0573951 915 m -2- SOM MAI RE 1241-2-1 O
16、CEI:1994 Pages AVANT-PROPOS INTRODUCTION . Artides Domaine dapplication Rfrences normatives D6f initions Mthode A: Couche de poussire sur une surface chauffe une temprature constante . 4.1 Prparation de lchantillon de poussire 4.2 Appareil dessai . 4.4 Critre dacceptation de lessai . 4.6 Application
17、 des rsultats 4.3 Mode opratoire 4.5 Rapport dessai Mthode B: Nuages de poussire dans un four temprature constante . 5.1 Prparation de lchantillon de poussire 5.2 Appareil dessai . 5.3 Mode opratoire 5.4 Critre dinflammation . 5.5 5.6 Rapport dessai Temprature minimale dinflammation dun nuage de pou
18、ssire Figures Annexes A B Construction de la surface chauffe et mesure de la rpartition de temprature sur la plaque chauffe . Construction dun four a temprature constante . 4 6 8 8 10 10 10 12 14 18 20 20 22 22 22 22 24 24 26 32 28 40 Copyright International Electrotechnical Commission Provided by I
19、HS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-4844893 0573952 853 1241 -2-1 0 IEC: 1 994 -3- CONTENTS Page FOREWORD 5 INTRODUCTION . 7 Chuse Scope 9 Normative references 9 Definitions . 11 Method A: Dust layer on a heated surface at a con
20、stant temperature . 11 4.1 Preparation of dust sample 4.2 Test apparatus . 4.3 Procedure . 4.4 Test acceptance criteria . 4.5 Reporting of results Method B: Dust cloud in a furnace at a constant temperature 5.1 Preparation of dust sample 5.2 Test apparatus . 5.3 Procedure . 5.4 Criterion of ignition
21、 5.5 Minimum ignition temperature of a dust cloud . 5.6 Reporting of results . 4.6 Application of results 11 13 15 19 21 21 23 23 23 23 25 25 27 Figures 33 Annexes A B Construction of a constant temperature furnace . 41 Construction of a heated surface and measurement of temperature distribution on
22、heated surface . 31 Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-48Ci489L 0573953 798 DIS 31H(BC)9 -4- 1241-2-1 O CEIr1994 COMMISSION LECTROTECHNIQUE INTERNATIONALE Rapport
23、 de vote 31H(BC)14 MATERIELS LECTRIQUES DESTINES A TRE UTILISES EN PRSENCE DE POUSSIERES COMBUSTIBLES - Partie 2: Mthodes dessai - Section 1 : Mthodes de dtermination de la temprature minimale dinflammation de la poussire AVANT-PROPOS i) La CE1 (Commission Electrotechnique Internationale) est une or
24、ganisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CE1 a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la C
25、EI. entre autres activits. publie des Normes internationales. Leur laboration est confie . des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, part
26、icipent galement aux travaux. La CE1 collabore troitement avec lOrganisation Internationale de Normalisation (ISO). selon des conditions fixes par accord entre les deux organisations. 2) Les dcisions ou accords officiels de la CE1 en ce qui concerne les questions techniques, prpars par les comits dt
27、udes o sont reprsents tous les Comits nationaux sintressant ces questions, expriment dans la plus grande mesure possible un accord international sur les sujets examins. 3) Ces dcisions constituent des recommandations internationales publies sous forme de normes, de rapports techniques ou de guides e
28、t agres comme telles par les Comits nationaux. 4) Dans le but dencourager Iunifi+ion internationale, les Comits nationaux de la CE1 sengagent appliquer de faon transparente, dans toute la mesure possible, les Normes internationales de la CE1 dans leurs normes nationales et rgionales. Toute divergenc
29、e entre la norme de la CE1 et la norme nationale ou rgionale correspondante doit tre indique en termes clairs dans cette dernire. La Norme internationale CE1 1241-2-1 a t tablie par le sous-comit 31H: Matriels destins tre utiliss en prsence de poussires inflammables, du comit dtudes 31 de la CEI: Ma
30、triel lectrique pour atmosphres explosives. Le texte de cette norme est issu des documents suivants: Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lapprobation de cette norme. Les annexes A et B font partie intgrante de cette norme. Copyright In
31、ternational Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 4844893 0573754 b24 1241-2-1 O IEC:1994 -5- INTERNATIONAL ELECTROTECHNICAL COMMISSION ELECTRICAL APPARATUS FOR USE IN THE PRESENCE OF COMB
32、USTIBLE DUST - Part 2: Test methods - Section 1 : Methods for determining the minimum ignition temperatures of dust FOREWORD The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committee
33、s). The object of the IEC is to promote international cooperation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; a
34、ny IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Sta
35、ndardization (ISO) in accordance with conditions determined by agreement between the two organizations. The formal decisions or agreements of the IEC on technical matters, prepared by technical committees on which all the National Committees having a special interest therein are represented, express
36、, as nearly as possible, an international consensus of opinion on the subjects dealt with. They have the form of recommendations for international use published in the form of standards, technical reports or guides and they are accepted by the National Committees in that sense. In order to promote i
37、nternational unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and regional standards. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicat
38、ed in the latter. International Standard IEC 1241 -2-1 has been prepared by sub-committee 31 H: Apparatus for use in the presence of ignitable dust, of IEC technical committee 31: Electrical apparatus for explosive atmospheres. The text of this standard is based on the following documents: r- DIS r-
39、 Report on voting I I 31H(C0)9 I 31H(CO)14 I Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. Annexes A and B form an integral part of this standard. Copyright International Electrotechnical Commission Provided by IHS
40、 under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-4844893 0573955 560 H -6- 1241 -2-1 O CEI: 1994 INTRODUCTION Cette section de la CE1 1241-2 dcrit les mthodes pour la dtermination des tempra- tures minimales dinflammation de la poussiere, qui
41、sont: - mthode A: Couche de poussire sur une surface chauffe une temprature constante (article 4); - mthode 6: Nuage de poussire dans un four temprature constante (article 5). La mthode A dtermine la temprature minimale dinflammation dune couche de poussire sur une surface chauffe donne. La mthode B
42、 dtermine la temprature minimale dinflammation dun nuage de poussire dans un four chauff donn. Les mthodes dessai sont gnrales et peuvent - method B: Dust cloud in a furnace at a constant temperature (clause 5). Method A determines the minimum ignition temperature of a dust layer on a prescribed hea
43、ted surface. Method i3 determines the minimum ignition temperature of a dust cloud within a prescribed heated furnace. The test methods are of a general nature, and may be used for purposes of comparison, but in certain industrial situations further tests may be necessary. The methods for determinin
44、g the minimum ignition temperatures are not suitable for use with recognized explosives, for example, gunpowder, dynamite, or mixtures of substances which may, under some circumstances, behave similarly. Where there is doubt, an indication of the existence of a hazard due to explosive pro- perties m
45、ay be obtained by testing a very small quantity of the dust on a surface at 400 OC or higher, located remotely from the operator. Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,
46、-,-a- 1241-2-1 OCEI:1994 MATRIELS LECTRIQUES DESTINS TRE UTILISS EN PRSENCE DE POUSSIRES COMBUSTIBLES - Partie 2: Mthodes dessai - Section 1 : Mthodes de dtermination de la temprature minimale dinflammation de la poussire 1 Domaine dapplication La prsente section de la CE1 1241-2 indique deux mthode
47、s dessai pour la dtermi- nation de la temprature minimale dinflammation de la poussire. Les mthodes ne sont pas applicables aux substances qui ont des proprits explosives. La mthode A (article 4) est applicable la dtermination de la temprature minimale dune surface chaude donne qui conduira la dcomp
48、osition eou linflammation dune couche de poussire dpaisseur donne, dpose sur celle-ci. La mthode sapplique particulirement aux installations industrielles pour lesquelles les poussires sont prsentes sur des surfaces chaudes en couches minces en contact avec latmosphre. La mthode B (article 5) est applicable la dtermination de la temprature minimale dune surface chaude donne qui conduira linflammation du nuage de poussire ou dun solide particulaire.
