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    IEC 60512-7-2-2011 Connectors for electronic equipment - Tests and measurements - Part 7-2 Impact tests (free connectors) - Test 7b Mechanical strength impact《电.pdf

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    IEC 60512-7-2-2011 Connectors for electronic equipment - Tests and measurements - Part 7-2 Impact tests (free connectors) - Test 7b Mechanical strength impact《电.pdf

    1、 IEC 60512-7-2 Edition 1.0 2011-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 7-2: Impact tests (free connectors) Test 7b: Mechanical strength impact Connecteurs pour quipements lectroniques Essais et mesures Partie 7-2: Essais dimpact

    2、 (fiches) Essai 7b: Rsistance mcanique aux chocs IEC60512-7-2:2011 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mec

    3、hanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the a

    4、ddress below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la ph

    5、otocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national

    6、 de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all

    7、 electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.i

    8、ec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IEC publi

    9、cations. Just Published details twice a month all new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with e

    10、quivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or cont

    11、act us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies appa

    12、rentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Cata

    13、logue en-ligne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les n

    14、ouvelles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes e

    15、t dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette public

    16、ation ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-7-2 Edition 1.0 2011-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 7-2: Im

    17、pact tests (free connectors) Test 7b: Mechanical strength impact Connecteurs pour quipements lectroniques Essais et mesures Partie 7-2: Essais dimpact (fiches) Essai 7b: Rsistance mcanique aux chocs INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE H ICS 31.220.01,

    18、 31.220.10 PRICE CODE CODE PRIX ISBN 978-2-88912-775-7 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-7-2 IEC:2011 CONTENTS FOREWORD . 3 1 Scope and object 5 2 Normative references . 5 3 Preparation 5 3.1 Pr

    19、eparation of the specimen 5 3.2 Equipment . 5 3.3 Mounting . 5 4 Test method . 6 5 Test requirements 6 6 Details to be specified 7 Bibliography 8 Figure 1 Example of mounting arrangement . 6 60512-7-2 IEC:2011 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AN

    20、D MEASUREMENTS Part 7-2: Impact tests (free connectors) Test 7b: Mechanical strength impact FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC

    21、 is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS)

    22、and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with t

    23、he IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearl

    24、y as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that

    25、sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees

    26、undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any

    27、 attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edi

    28、tion of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether di

    29、rect or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispen

    30、sable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-7-2

    31、 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces Test 7b of IEC 60512-5, issued in 1992. The structure of the test documents in the IEC 60512 series i

    32、s explained in IEC 60512-1-100. The text of this standard is based on the following documents: FDIS Report on voting 48B/2258/FDIS 48B/2269/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. 4 60512-7-2 IEC:2011 Thi

    33、s publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publicat

    34、ion will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 60512-7-2 IEC:2011 5 CONNECTORS FOR

    35、 ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 7-2: Impact tests (free connectors) Test 7b: Mechanical strength impact 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be us

    36、ed for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to assess the ability of a free connector on the end of a cable or wire bundle to withstand impacts it could receive when dropped onto a hard surface. 2 Normative referenc

    37、es The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1: Connectors for electronic equip

    38、ment Tests and measurements Part 1-1: General examination, Test 1a: Visual examination 3 Preparation Preparation of the specimen 3.1The specimen shall consist of a free connector or a similar component with its accessories fitted in the normal manner and wired as used in the normal application. The

    39、specimen shall be prepared in accordance with the detail specification. Unless otherwise specified, the specimen shall be pre-conditioned at a temperature between 15 C and 35 C and a RH between 25 % and 75 % RH during 48 h. If the component is normally provided for use with different types of cables

    40、, the thinnest and/or most flexible type shall be used. The length of the cable or wire bundle shall allow the rear of the specimen to be (2 250 10) mm from the point of attachment. Equipment 3.2A steel plate 300 mm 500 mm of 25 mm thickness shall be positioned so that the component under test will

    41、fall onto it. Mounting 3.3The specimen shall be attached in an appropriate manner at a distance of (2 250 10) mm from the rear of the component so that the specimen may swing freely from a horizontal to a vertical position as shown in Figure 1. 6 60512-7-2 IEC:2011 NOTE An appropriate manner may be

    42、the attachment to a swivel. In many cases, however, simply attaching to a hook may be sufficient. The specimen shall be attached at one of the following preferred heights: (2 000 10) mm (1 750 10) mm (1 500 10) mm (1 250 10) mm (1 000 10) mm ( 750 10) mm ( 500 10) mm 4 Test method Dimensions in mill

    43、imetres 2 250 HeightSteel plate IEC 2510/11 Figure 1 Example of mounting arrangement The specimen, attached at the specified height, shall be held in a horizontal position in an attitude as specified and dropped on to the steel plate. This cycle shall be repeated for a total number of 3 times unless

    44、 otherwise specified in the detail specification. NOTE For guidance, IEC 60068-2-31:2008 may be referenced. 5 Test requirements The component shall be visually examined according to IEC 60512-1-1, test 1a. There shall be no broken parts or damage that would impair operation. 60512-7-2 IEC:2011 7 6 D

    45、etails to be specified When this test is required by the detail specification, the following details shall be specified: a) preparation and pre-conditioning of the specimen; b) type of accessory, when required; c) cable or wire to be used; d) test ambient conditions, if other than standard atmospher

    46、ic conditions; e) height or heights from which the component is to be dropped; f) number of dropping cycles at each height; g) change of orientation of the sample (e.g. rotation over 45 ) after each drop, if applicable; h) operational tests and requirements; i) attitude of the specimen; j) any devia

    47、tion from the standard test method. 8 60512-7-2 IEC:2011 Bibliography IEC 60068-2-31:2008: Environmental testing Part 2-31: Tests Test Ec: Rough handling shocks, primarily for equipment-type specimens IEC 60512-1: Connectors for electronic equipment Tests and measurements Part 1: General IEC 60512-1

    48、-100: Connectors for electronic equipment Tests and measurements Part 1-100: General Applicable publications _ 10 60512-7-2 CEI:2011 SOMMAIRE AVANT-PROPOS 11 1 Domaine dapplication et objet 13 2 Rfrences normatives . 13 3 Prparation 13 3.1 Prparation du spcimen . 13 3.2 quipement . 13 3.3 Montage 13 4 Mthode dessai . 14 5 Exigences dessai . 14 6 Dtails spcifier . 15 Bibliographie . 16 Figure 1 Exemple dispositif de montage dessai . 14 60512-7-2 CEI:2011 11 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 7-2: Essais dimpact (fi


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