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    IEC 60512-16-3-2008 Connectors for electronic equipment - Tests and measurements - Part 16-3 Mechanical tests on contacts and terminations - Test 16c Contact-be.pdf

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    IEC 60512-16-3-2008 Connectors for electronic equipment - Tests and measurements - Part 16-3 Mechanical tests on contacts and terminations - Test 16c Contact-be.pdf

    1、 IEC 60512-16-3Edition 1.0 2008-07INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equipment Tests and measurements Part 16-3: Mechanical tests on contacts and terminations Test 16c: Contact-bending strength Connecteurs pour quipements lectroniques Essais et mesures Partie 16-3:

    2、Essais mcaniques des contacts et des sorties Essai 16c: Tenue des contacts au pliage IEC60512-16-3:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any fo

    3、rm or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to t

    4、his publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lec

    5、tronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes c

    6、i-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publ

    7、ishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published.

    8、 Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub

    9、 Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and defi

    10、nitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit th

    11、e Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit,

    12、llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.i

    13、ec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online

    14、_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques

    15、. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous don

    16、ner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-16-3Edition 1.0 2008-07INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equipment

    17、Tests and measurements Part 16-3: Mechanical tests on contacts and terminations Test 16c: Contact-bending strength Connecteurs pour quipements lectroniques Essais et mesures Partie 16-3: Essais mcaniques des contacts et des sorties Essai 16c: Tenue des contacts au pliage INTERNATIONAL ELECTROTECHNIC

    18、AL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE GICS 31.220.10 PRICE CODECODE PRIXISBN 2-8318-9879-X Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-16-3 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMI

    19、SSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-3: Mechanical tests on contacts and terminations Test 16c: Contact-bending strength FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national elect

    20、rotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specific

    21、ations, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. Internation

    22、al, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal de

    23、cisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for int

    24、ernational use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In

    25、order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be

    26、clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability

    27、shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including

    28、legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this

    29、publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-16-3 has been prepared by subcommittee 48B, C

    30、onnectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces test 16c of IEC 60512-8, issued in 1993. This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which explains the st

    31、ructure of the IEC 60512 series. The text of this standard is based on the following documents: FDIS Report on voting 48B/1885/FDIS 48B/1918/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. 60512-16-3 IEC:2008 3 T

    32、his publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this pu

    33、blication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 4 60512-16-3 IEC:200

    34、8 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 16-3: Mechanical tests on contacts and terminations Test 16c: Contact-bending strength 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing electrical connectors within the scope of

    35、 technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this part of IEC 60512 is to detail a standard test method to determine the ability of a contact to withstand a specified bending moment or force. If so specified in the detail sp

    36、ecification, forces other than bending may be applied. Although this test is illustrated for the mating area of cylindrical contacts, and is particularly applicable to those with a mating diameter of 1,2 mm or less, its use for contacts with other geometries is not excluded. In which case, the detai

    37、l specification shall contain sufficient detail, given under Clause 6, i), j) and k), to enable the test to be done. Furthermore, it may be used for any part of a connector (such as a keying or polarizing device; cable support or contact latching feature) provided that sufficient detail is given in

    38、the detail specification. NOTE In some cases, IEC 60068-2-21 may be cited in the detail specification. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the l

    39、atest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination 3 Preparations 3.1 Preparation of specimen The specimen shall consist of a contact with its

    40、 terminations, and may be wired if so specified in the detail specification. Any preconditioning given in the detail specification shall be applied. 3.2 Equipment For the application of the specified loads, a suitable device able to provide the controls on the loads (intensity, rate of increase, tim

    41、e of constant load application) shall be required (e.g.: a universal materials testing machine). If the detail specification requires special preconditioning of the specimen, all the necessary equipment and process steps describing such conditioning shall be included. 60512-16-3 IEC:2008 5 4 Mountin

    42、g If mounting of the specimen is appropriate, it shall be as specified in the detail specification. Figure 1 shows an example of mounting and clarifies details to be given in the detail specification. SpP M L 0,8L IEC 1004/08 Key L Full engagement length of the contact under test P Point and directi

    43、on of application of force SpPermanent set M Mounting or support means Figure 1 Contact bending (example) 5 Test method 5.1 General The specified bending moment or force shall be applied, at a specified rate until the specified value is reached. This shall be maintained for 1 minute. The load shall

    44、then be removed. This procedure shall be applied at four points mutually at right angles to each other. For solid (e.g. turned) cylindrical contacts that are axi-symmetrical, only one procedure is necessary. If permanent set, exceeding that allowed, results from the foregoing, a new sample shall be

    45、used. NOTE In the case of asymmetric (stamped and formed) contacts, more procedures should be performed choosing worst case positions.5.2 Measurements and requirements 5.2.1 Before testing Visual examination according to IEC 60512-1-1 shall be carried out. 6 60512-16-3 IEC:2008 5.2.2 During testing

    46、The deflection and permanent set of the contact, measured at the point of application of that load shall be measured. NOTE In the case of a contact being made from a highly resilient material (e.g. spring steel or beryllium copper) the deflection may be large whilst the permanent set is negligible.

    47、The permanent set shall not exceed any value(s) given in the detail specification 5.2.3 After testing Visual examination according to IEC 60512-1-1 shall be carried out. 6 Details to be specified When this test is required by a detail specification, the following shall be given therein. a) if precon

    48、ditioning is required; b) if the specimen is to be wired, if so details of this; c) if special mounting of the specimen is required; d) maximum force to be applied; e) point of application of force and relationship to mounting or support means; f) rate application of force; g) any allowable permanen

    49、t set; h) number of specimens to be tested; i) if IEC 60068-2-21 is to be used; j) if the geometry of the contact requires special equipment, and if so, details of this; k) any deviation from the standard test method. 60512-16-3 IEC:2008 7 Bibliography IEC 60068-2-21:2006, Environmental testing Part 2-21: Tests Test U: Robustness of terminations and integral mounting devices _


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