1、SPCIFICATION TECHNIQUE CEI IEC TECHNICAL SPECIFICATION TS61944 Premiredition Firstedition 200001 Circuitsintgrs Agrmentdunelignedefabrication Vhiculesdedmonstration Integratedcircuits Manufacturinglineapproval Demonstrationvehicles Numroderfrence Referencenumber IEC/TS61944:2000Numrosdespublications
2、 Depuisle1erjanvier1997,lespublicationsdelaCEI sontnumrotespartirde60000. Publicationsconsolides Lesversionsconsolidesdecertainespublicationsde laCEIincorporantlesamendementssontdisponibles. Parexemple,lesnumrosddition1.0,1.1et1.2 indiquentrespectivementlapublicationdebase,la publicationdebaseincorp
3、orantlamendement1,etla publicationdebaseincorporantlesamendements1 et2. Validitdelaprsentepublication LecontenutechniquedespublicationsdelaCEIest constammentrevuparlaCEIafinquilreflteltat actueldelatechnique. Desrenseignementsrelatifsladatedereconfir mationdelapublicationsontdisponiblesdansle Catalo
4、guedelaCEI. Lesrenseignementsrelatifsdesquestionsltudeet destravauxencoursentreprisparlecomittechnique quiatablicettepublication,ainsiquelalistedes publicationstablies,setrouventdanslesdocumentsci dessous: SitewebdelaCEI* CataloguedespublicationsdelaCEI Publiannuellementetmisjour rgulirement (Catalo
5、gueenligne)* BulletindelaCEI DisponiblelafoisausitewebdelaCEI* etcommepriodiqueimprim Terminologie,symbolesgraphiques etlittraux Encequiconcernelaterminologiegnrale,lelecteur sereporteralaCEI60050: VocabulaireElectro techniqueInternational (VEI). Pourlessymbolesgraphiques,lessymboleslittraux etlessi
6、gnesdusagegnralapprouvsparlaCEI,le lecteurconsulteralaCEI60027: Symboleslittraux utiliserenlectrotechnique,laCEI60417:Symboles graphiquesutilisablessurlematriel.Index,relevet compilationdesfeuillesindividuelles, etlaCEI60617: Symbolesgraphiquespourschmas. * Voiradressesitewebsurlapagedetitre. Number
7、ing Asfrom1January1997allIECpublicationsare issuedwithadesignationinthe60000series. Consolidatedpublications ConsolidatedversionsofsomeIECpublications includingamendmentsareavailable.Forexample, editionnumbers1.0,1.1and1.2refer,respectively,to thebasepublication,thebasepublicationincor poratingamend
8、ment1andthebasepublication incorporatingamendments1and2. Validityofthispublication ThetechnicalcontentofIECpublicationsiskept underconstantreviewbytheIEC,thusensuringthat thecontentreflectscurrenttechnology. Informationrelatingtothedateofthereconfirmation ofthepublicationisavailableintheIECcatalogue
9、. Informationonthesubjectsunderconsiderationand workinprogressundertakenbythetechnical committeewhichhaspreparedthispublication,aswell asthelistofpublicationsissued,istobefoundatthe followingIECsources: IECwebsite* CatalogueofIECpublications Publishedyearlywithregularupdates (Onlinecatalogue)* IECBu
10、lletin AvailablebothattheIECwebsite*and asaprintedperiodical Terminology,graphicalandletter symbols Forgeneralterminology,readersarereferredto IEC60050:InternationalElectrotechnicalVocabulary (IEV). Forgraphicalsymbols,andlettersymbolsandsigns approvedbytheIECforgeneraluse,readersare referredtopubli
11、cationsIEC60027: Lettersymbolsto beusedinelectricaltechnology ,IEC60417: Graphical symbolsforuseonequipment.Index,surveyand compilationofthesinglesheets andIEC60617: Graphicalsymbolsfordiagrams. * Seewebsiteaddressontitlepage.SPCIFICATION TECHNIQUE CEI IEC TECHNICAL SPECIFICATION TS61944 Premirediti
12、on Firstedition 200001 Circuitsintgrs Agrmentdunelignedefabrication Vhiculesdedmonstration Integratedcircuits Manufacturinglineapproval Demonstrationvehicles Commission Electrotechnique Internationale InternationalElectrotechnicalCommission Pourprix,voircatalogueenvigueur Forprice,seecurrentcatalogu
13、e IEC2000Droitsdereproductionrservs Copyrightallrightsreserved Aucunepartiedecettepublicationnepeuttrereproduiteni utilisesousquelqueformequecesoitetparaucunprocd, lectroniqueoumcanique,ycomprislaphotocopieetles microfilms,sanslaccordcritdelditeur. Nopartofthispublicationmaybereproducedorutilizedin
14、anyformorbyanymeans,electronicormechanical, includingphotocopyingandmicrofilm,withoutpermissionin writingfromthepublisher. InternationalElectrotechnicalCommission 3,ruedeVarembGeneva,Switzerland Telefax:+41229190300 email:inmailiec.ch IECwebsitehttp:/www.iec.ch CODEPRIX PRICECODE H2 TS61944 CEI:2000
15、 SOMMAIRE Pages AVANTPROPOS .4 Articles 1 Domainedapplication 8 2 Composantdvaluationstandard(SEC) 8 3 Programmeconcernantlevhiculedecaractrisationtechnologique(TCV). 10 4 Moniteurparamtrique(PM). 12TS61944 IEC:2000 3 CONTENTS Page FOREWORD 5 Clause 1 Scope 9 2 Standardevaluationcomponent(SEC). 9 3
16、Technologycharacterizationvehicle(TCV)program 11 4 Parametricmonitor(PM) 134 TS61944 CEI:2000 COMMISSIONLECTROTECHNIQUEINTERNATIONALE _ CIRCUITSINTGRS AGRMENTDUNELIGNEDEFABRICATION VHICULESDEDMONSTRATION AVANTPROPOS 1) LaCEI(CommissionlectrotechniqueInternationale)estuneorganisationmondialedenormali
17、sation composedelensembledescomitslectrotechniquesnationaux(ComitsnationauxdelaCEI).LaCEIa pourobjetdefavoriserlacooprationinternationalepourtouteslesquestionsdenormalisationdansles domainesdellectricitetdellectronique.Aceteffet,laCEI,entreautresactivits,publiedesNormes internationales.Leurlaboratio
18、nestconfiedescomitsdtudes,auxtravauxdesquelstoutComitnational intressparlesujettraitpeutparticiper.Lesorganisationsinternationales,gouvernementalesetnon gouvernementales,enliaisonaveclaCEI,participentgalementauxtravaux.LaCEIcollaboretroitement aveclOrganisationInternationaledeNormalisation(ISO),selo
19、ndesconditionsfixesparaccordentreles deuxorganisations. 2) LesdcisionsouaccordsofficielsdelaCEIconcernantlesquestionstechniquesreprsentent,danslamesure dupossible,unaccordinternationalsurlessujetstudis,tantdonnquelesComitsnationauxintresss sontreprsentsdanschaquecomitdtudes. 3) Lesdocumentsproduitss
20、eprsententsouslaformederecommandationsinternationales.Ilssontpublis commenormes,spcificationstechniques,rapportstechniquesouguidesetagrscommetelsparles Comitsnationaux. 4) Danslebutdencouragerlunificationinternationale,lesComitsnationauxdelaCEIsengagentappliquerde faontransparente,danstoutelamesurep
21、ossible,lesNormesinternationalesdelaCEIdansleursnormes nationalesetrgionales.ToutedivergenceentrelanormedelaCEIetlanormenationaleourgionale correspondantedoittreindiqueentermesclairsdanscettedernire. 5) LaCEInafixaucuneprocdureconcernantlemarquagecommeindicationdapprobationetsaresponsabilit nestpase
22、ngagequandunmatrielestdclarconformelunedesesnormes. 6)Lattentionestattiresurlefaitquecertainsdeslmentsdelaprsentespcificationtechniquepeuventfaire lobjetdedroitsdepropritintellectuelleoudedroitsanalogues.LaCEInesauraittretenuepour responsabledenepasavoiridentifidetelsdroitsdepropritetdenepasavoirsig
23、nalleurexistence. LatcheprincipaledescomitsdtudesdelaCEIestllaborationdesNormes internationales.Exceptionnellement,uncomitdtudespeutproposerlapublicationdune spcificationtechnique lorsquendpitdemaintsefforts,laccordrequisnepeuttreralisenfaveurdela publicationduneNormeinternationale,ou lorsquelesujet
24、enquestionestencoreencoursdedveloppementtechniqueouquand, pouruneraisonquelconque,lapossibilitdunaccordpourlapublicationduneNorme internationalepeuttreenvisagepourlavenirmaispasdanslimmdiat. Lesspcificationstechniquesfontlobjetdunnouvelexamentroisansauplustardaprsleur publicationafindedciderventuell
25、ementdeleurtransformationenNormesinternationales. LaCEI61944,quiestunespcificationtechnique,attablieparlesouscomit47A: Circuitsintgrs,ducomitdtudes47delaCEI:Dispositifssemiconducteurs. Letextedecettespcificationtechniqueestissudesdocumentssuivants: Projetdenqute Rapportdevote 47A/522/CDV 47A/554/RVC
26、 Lerapportdevoteindiqudansletableaucidessusdonnetouteinformationsurlevoteayant aboutilapprobationdecettespcificationtechnique.TS61944 IEC:2000 5 INTERNATIONALELECTROTECHNICALCOMMISSION _ INTEGRATEDCIRCUITS MANUFACTURINGLINEAPPROVAL DEMONSTRATIONVEHICLES FOREWORD 1) TheIEC(InternationalElectrotechnic
27、alCommission)isaworldwideorganizationforstandardizationcomprising allnationalelectrotechnicalcommittees(IECNationalCommittees).TheobjectoftheIECistopromote internationalcooperationonallquestionsconcerningstandardizationintheelectricalandelectronicfields.To thisendandinadditiontootheractivities,theIE
28、CpublishesInternationalStandards.Theirpreparationis entrustedtotechnicalcommittees;anyIECNationalCommitteeinterestedinthesubjectdealtwithmay participateinthispreparatorywork.International,governmentalandnongovernmentalorganizationsliaising withtheIECalsoparticipateinthispreparation.TheIECcollaborate
29、scloselywiththeInternational OrganizationforStandardization(ISO)inaccordancewithconditionsdeterminedbyagreementbetweenthe twoorganizations. 2) TheformaldecisionsoragreementsoftheIEContechnicalmattersexpress,asnearlyaspossible,an internationalconsensusofopinionontherelevantsubjectssinceeachtechnicalc
30、ommitteehasrepresentation fromallinterestedNationalCommittees. 3) Thedocumentsproducedhavetheformofrecommendationsforinternationaluseandarepublishedintheform ofstandards,technicalspecifications,technicalreportsorguidesandtheyareacceptedbytheNational Committeesinthatsense. 4) Inordertopromoteinternat
31、ionalunification,IECNationalCommitteesundertaketoapplyIECInternational Standardstransparentlytothemaximumextentpossibleintheirnationalandregionalstandards.Any divergencebetweentheIECStandardandthecorrespondingnationalorregionalstandardshallbeclearly indicatedinthelatter. 5) TheIECprovidesnomarkingpr
32、oceduretoindicateitsapprovalandcannotberenderedresponsibleforany equipmentdeclaredtobeinconformitywithoneofitsstandards. 6)Attentionisdrawntothepossibilitythatsomeoftheelementsofthistechnicalspecificationmaybethesubject ofpatentrights.TheIECshallnotbeheldresponsibleforidentifyinganyorallsuchpatentri
33、ghts. ThemaintaskofIECtechnicalcommitteesistoprepareInternationalStandards.In exceptionalcircumstances,atechnicalcommitteemayproposethepublicationofatechnical specificationwhen therequiredsupportcannotbeobtainedforthepublicationofanInternationalStandard, despiterepeatedefforts,or Thesubjectisstillun
34、dertechnicaldevelopmentorwhere,foranyotherreason,thereis thefuturebutnoimmediatepossibilityofanagreementonanInternationalStandard. Technicalspecificationsaresubjecttoreviewwithinthreeyearsofpublicationtodecide whethertheycanbetransformedintoInternationalStandards. IEC61944,whichisatechnicalspecifica
35、tion,hasbeenpreparedbysubcommittee47A: Integratedcircuits,ofIECtechnicalcommittee47:Semiconductordevices. Thetextofthistechnicalspecificationisbasedonthefollowingdocuments: Enquirydraft Reportonvoting 47A/522/CDV 47A/554/RVC Fullinformationonthevotingfortheapprovalofthistechnicalspecificationcanbefo
36、undin thereportonvotingindicatedintheabovetable.6 TS61944 CEI:2000 CettepublicationatrdigeselonlesDirectivesISO/CEI,Partie3. Lecomitadcidquelecontenudecettepublicationneserapasmodifiavant2003. Acettedate,lapublicationsera reconduite; supprime; remplaceparuneditionrvise,ou amende.TS61944 IEC:2000 7 T
37、hispublicationhasbeendraftedinaccordancewiththeISO/IECDirectives,Part3. Thecommitteehasdecidedthatthecontentsofthispublicationwillremainunchangeduntil 2003.Atthisdate,thepublicationwillbe reconfirmed; withdrawn; replacedbyarevisededition,or amended.8 TS61944 CEI:2000 CIRCUITSINTGRS AGRMENTDUNELIGNED
38、EFABRICATION VHICULESDEDMONSTRATION 1Domaine dapplication Laprsentespcificationtechniquetablitlescaractristiquesdescomposantsdvaluation standard(SEC)utilisspourvrifierlesavoirfaireetlafiabilit. 2 Composantdvaluationstandard(SEC) Uncomposantdvaluationstandard(SEC)estuncomposantdessaispcialementconuou
39、 unproduitcommercialprisdirectementdanslaproductionetutilispourvrifierlesavoir faire(partiellementoutotalement)etlafiabilitenaccordaveclemanueldeprocd. LesSECsontutilissdansleprogrammedessaidelaqualificationpourdfinirlesavoir faire. Pourlamaintenance,cesessaisdoiventdmontrerlesaspectsqualitetsoittou
40、tesles limitesdusavoirfairesoitleslimitesdusavoirfairerelativesauxproduitssortislorsdela priodelaplusrcente. DeuxtypesdecomposantspeuventtreutilisscommeSEC: TypeI:Uncomposantspcialementconuetfabriqupourvrifierlesrglesdeconception etleprocddefabrication. TypeII:Unproduitcommercialprisdanslaproduction
41、. Ilnestgnralementpaspossibledecouvrirtoutesleslimitesettouslesaspectsqualitdu savoirfaireavecunseulSEC.Unseultypeouunecombinaisondesdeuxtypespeuventtre utiliss,etcollectivementdoiventpermettredevrifierlesrglesdeconceptionpirecas,les matriaux,lesprocdsdefabricationetlesaspectsqualit.Quandonprt endqu
42、un lmentdiffus/mtallis,ouungroupedlments,peutmettreenoeuvreuneouplusieurs limites,ceslmentsougroupesdlmentsdoiventtremesurablessparmentsans influencedautreslmentsducomposant. LeSECdoittredocumentycomprissurlamthodedeconceptionetlesoutilslogiciels utiliss,lesfonctionsquildoitraliser,sesdimensionsentermesdetransistorsutilesoude nombredeportesetlessimulations
