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19、h. IEC 62754 Edition 1.0 2017-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Computation of waveform parameter uncertainties Calcul des incertitudes des paramtres des formes donde INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 17.220.20 ISBN 978-2-8322-4345-
20、9 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un d
21、istributeur agr. colour inside 2 IEC 62754:2017 IEC 2017 CONTENTS FOREWORD . 4 1 Scope 6 2 Normative references 6 3 Terms and definitions 6 4 Waveform measurement 16 4.1 General . 16 4.2 Waveform parameters . 17 4.3 Waveform measurement process 17 4.3.1 General . 17 4.3.2 General description of the
22、measurement system 18 5 Waveform and waveform parameter corrections 19 5.1 General . 19 5.2 Waveform parameter corrections 19 5.3 Waveform corrections and waveform reconstruction 20 5.3.1 General . 20 5.3.2 Sample-by-sample correction 20 5.3.3 Entire waveform correction 20 6 Uncertainties . 22 6.1 G
23、eneral . 22 6.2 Propagation of uncertainties . 22 6.2.1 General . 22 6.2.2 Uncorrelated input quantities . 23 6.2.3 Correlated input quantities . 23 6.3 Pooled data and its standard deviation 23 6.4 Expanded uncertainty and coverage factor 25 6.4.1 General . 25 6.4.2 Effective degrees of freedom . 2
24、7 6.5 Entire waveform uncertainties . 28 7 Waveform parameter uncertainties 29 7.1 General . 29 7.2 Amplitude parameters . 30 7.2.1 State levels 30 7.2.2 State boundaries . 35 7.2.3 Waveform amplitude (state levels) . 36 7.2.4 Impulse amplitude (state levels) 37 7.2.5 Percent reference levels (state
25、 levels, waveform amplitude) 37 7.2.6 Transition settling error (state levels, waveform amplitude) 38 7.2.7 Overshoot aberration (state levels, waveform amplitude) . 38 7.2.8 Undershoot aberration (state levels, waveform amplitude) . 39 7.3 Temporal parameters 39 7.3.1 Initial instant 39 7.3.2 Wavef
26、orm epoch 40 7.3.3 Reference level instants (percent reference levels, waveform epoch, initial instant) . 41 7.3.4 Impulse centre instant (impulse amplitude, reference level instants) 42 7.3.5 Transition duration (reference level instants) . 42 IEC 62754:2017 IEC 2017 3 7.3.6 Transition settling dur
27、ation (reference level instants) . 43 7.3.7 Pulse duration (reference level instants) 43 7.3.8 Pulse separation (reference level instants) 43 7.3.9 Waveform delay (advance) (reference level instants) . 44 8 Monte Carlo method for waveform parameter uncertainty estimates 44 8.1 General guidance and c
28、onsiderations . 44 8.2 Example: state level 44 Annex A (informative) Demonstration example for the calculation of the uncertainty of state levels using the histogram mode according to 7.2.1.2. 46 A.1 Waveform measurement . 46 A.2 Splitting the bimodal histogram and determining the state levels . 46
29、A.3 Uncertainty of state levels . 47 Annex B (informative) Computation of L and Y for estimating the uncertainty of state levels using the shorth method according to 7.2.1.3 . 49 Bibliography 52 Figure 1 Reference levels, reference level instants, waveform amplitude, and transition duration for a si
30、ngle positive-going transition . 7 Figure 2 Overshoot, undershoot, state levels, and state boundaries for a single positive-going transition 11 Figure 3 Creation of measured, corrected, and reconstructed waveforms and the final estimate of the input signal 17 Figure 4 Example of waveform bounds focu
31、sing on the trajectories that impact pulse parameter measurements . 28 Figure 5 Relationship between selected waveform parameters 30 Figure A.1 Waveform obtained from the measurement of a step-like signal from which the state levels and uncertainties are calculated . 46 Figure A.2 Histograms of stat
32、e s1 (a) and state s2 (b) of the step-like waveform plotted in Figure A.1 . 47 Figure B.1 Diagram showing location of waveform elements, ( ) ( ) y , in Y 1and Y 2 , and the construction of Y from Y 1and Y 2. 49 Table 1 Value of the coverage factor k pthat encompasses the fraction p of the t - distri
33、bution for different degrees of freedom (from ISO/IEC Guide 98-3) . 26 Table 2 Different methods for determining state levels, as given in IEC 60469, and their uncertainty type and method of computation . 31 Table 3 Different methods for determining state boundaries and their uncertainty type and me
34、thod of computation . 36 Table 4 Variables contributing to the uncertainty in overshoot 39 Table 5 Variables contributing to the uncertainty in the reference level instant . 42 Table A.1 Uncertainty contributions and total uncertainty for level(s i ) determined from histogram modes 48 4 IEC 62754:20
35、17 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The o
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46、IEC 62754 has been prepared by IEC technical committee 85: Measuring equipment for electrical and electromagnetic quantities. The text of this International Standard is based on the following documents: FDIS Report on voting 85/585/FDIS 85/X588/RVD Full information on the voting for the approval of
47、this International Standard can be found in the report on voting indicated in the above table. This document has been drafted in accordance with the ISO/IEC Directives, Part 2. The terms used throughout this document which have been defined in Clause 3 are in italic type. IEC 62754:2017 IEC 2017 5 T
48、he committee has decided that the contents of this document will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ in the data related to the specific document. At this date, the document will be reconfirmed, withdrawn, replaced by a revised edition
49、, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 6 IEC 62754:2017 IEC 2017 COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES 1 Scope This document specifies methods for the computation of the tempora
