1、 IEC 62475 Edition 1.0 2010-09 INTERNATIONAL STANDARD NORME INTERNATIONALE High-current test techniques Definitions and requirements for test currents and measuring systems Techniques des essais haute intensit Dfinitions et exigences relatives aux courants dessai et systmes de mesure IEC 62475:2010
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16、u Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62475 Edition 1.0 2010-09 INTERNATIONAL STANDARD NORME INTERNATIONALE High-current test techniques Definitions and requirements for test currents and measuring systems Techniques des essais haute in
17、tensit Dfinitions et exigences relatives aux courants dessai et systmes de mesure INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XE ICS 19.080 PRICE CODE CODE PRIX ISBN 978-2-88912-184-7 Registered trademark of the International Electrotechnical Commission Marqu
18、e dpose de la Commission Electrotechnique Internationale colour inside 2 62475 IEC:2010 CONTENTS FOREWORD.8 1 Scope.10 2 Normative references .10 3 Terms and definitions .10 3.1 Measuring systems11 3.2 Components of a measuring system11 3.3 Scale factors .12 3.4 Rated values .13 3.5 Definitions rela
19、ted to the dynamic behaviour .13 3.6 Definitions related to uncertainty .14 3.7 Definitions related to tests on measuring systems .16 4 Procedures for qualification and use of a measuring system.17 4.1 General principles .17 4.2 Schedule of performance tests 17 4.3 Schedule of performance checks.17
20、4.4 Requirements for the record of performance18 4.4.1 Contents of the record of performance.18 4.4.2 Exceptions.18 4.5 Operating conditions .18 4.6 Uncertainty19 5 Tests and test requirements for an approved measuring system.20 5.1 General requirements20 5.2 Calibration Determination of the scale f
21、actor 20 5.2.1 Calibration of a measuring system by comparison with a reference measuring system (preferred method) .20 5.2.2 Determination of the scale factor of a measuring system from those of its components 24 5.3 Linearity test .25 5.3.1 Application 25 5.3.2 Alternative methods in order of suit
22、ability 26 5.4 Dynamic behaviour26 5.5 Short-term stability 27 5.5.1 Method 27 5.5.2 Steady-state current 27 5.5.3 Impulse current and short-time current 28 5.5.4 Periodic impulse current and periodic short-time current28 5.6 Long-term stability.29 5.7 Ambient temperature effect .29 5.8 Effect of ne
23、arby current paths .30 5.9 Software effect 32 5.10 Uncertainty calculation 32 5.10.1 General .32 5.10.2 Uncertainty of calibration.32 5.10.3 Uncertainty of measurement using an approved measuring system .33 5.11 Uncertainty calculation of time-parameter measurements (impulse currents only)34 5.11.1
24、General .34 62475 IEC:2010 3 5.11.2 Uncertainty of the time-parameter calibration.34 5.11.3 Uncertainty of a time-parameter measurement using an approved measuring system .35 5.12 Interference test36 5.12.1 Application 36 5.12.2 Current-converting shunts and current transformers with iron 37 5.12.3
25、Inductive measuring systems without iron (Rogowski coils) .38 5.13 Withstand tests .38 5.13.1 Voltage withstand tests38 5.13.2 Current withstand tests39 6 Steady-state direct current .39 6.1 Application 39 6.2 Terms and definitions 39 6.3 Test current.39 6.3.1 Requirements 39 6.3.2 Tolerances 39 6.4
26、 Measurement of the test current40 6.4.1 Requirements for an approved measuring system40 6.4.2 Uncertainty contributions .40 6.4.3 Dynamic behaviour40 6.4.4 Calibrations and tests on an approved measuring system40 6.4.5 Performance check41 6.5 Measurement of ripple amplitude.41 6.5.1 Requirements fo
27、r an approved measuring system41 6.5.2 Uncertainty contributions .41 6.5.3 Dynamic behaviour for ripple .41 6.5.4 Calibrations and tests on an approved ripple-current measuring system.42 6.5.5 Measurement of the scale factor at the ripple frequency 42 6.5.6 Performance check for ripple current measu
28、ring system 42 6.6 Test procedures 43 7 Steady-state alternating current43 7.1 Application 43 7.2 Terms and definitions 43 7.3 Test current.43 7.3.1 Requirements 43 7.3.2 Tolerances 44 7.4 Measurement of the test current44 7.4.1 Requirements for an approved measuring system44 7.4.2 Uncertainty contr
29、ibutions .44 7.4.3 Dynamic behaviour44 7.4.4 Calibrations and tests on an approved measuring system46 7.4.5 Performance check47 7.5 Test procedures 47 8 Short-time direct current.47 8.1 Application 47 8.2 Terms and definitions 48 8.3 Test currents.49 8.3.1 Requirements for the test current 49 4 6247
30、5 IEC:2010 8.3.2 Tolerances 49 8.4 Measurement of the test current49 8.4.1 Requirements for an approved measuring system49 8.4.2 Uncertainty contributions .49 8.4.3 Dynamic behaviour49 8.4.4 Calibrations and tests on an approved measuring system50 8.4.5 Performance check51 8.4.6 Linearity test51 8.5
31、 Test procedures 51 9 Short-time alternating current .51 9.1 Application 51 9.2 Terms and definitions 52 9.3 Test current.53 9.3.1 Requirements for the test current 53 9.3.2 Tolerances 53 9.4 Measurement of the test current54 9.4.1 Requirements for an approved measuring system54 9.4.2 Uncertainty co
32、ntributions .54 9.4.3 Dynamic behaviour54 9.4.4 Calibrations and tests on an approved measuring system55 9.4.5 Performance check56 9.4.6 Linearity test56 9.4.7 Interference test 57 9.5 Test procedures 57 10 Impulse currents.57 10.1 Application 57 10.2 Terms and definitions 57 10.3 Test current.61 10
33、.3.1 General .61 10.3.2 Tolerances 61 10.4 Measurement of the test current62 10.4.1 Requirements for an approved measuring system62 10.4.2 Uncertainty contributions .62 10.4.3 Dynamic behaviour62 10.4.4 Calibrations and tests on an approved measuring system64 10.4.5 Performance check64 10.5 Test pro
34、cedures 65 11 Current measurement in high-voltage dielectric testing.65 11.1 Application 65 11.2 Terms and definitions 65 11.3 Measurement of the test current66 11.3.1 Requirements for an approved measuring system66 11.3.2 Uncertainty contributions .66 11.3.3 Dynamic behaviour66 11.3.4 Calibrations
35、and tests on an approved measuring system66 11.3.5 Performance check67 11.3.6 Linearity test67 11.3.7 Interference test 67 11.4 Test procedures 67 62475 IEC:2010 5 12 Reference measuring systems67 12.1 General .67 12.2 Interval between subsequent calibrations of reference measuring systems67 Annex A
36、 (informative) Uncertainty of measurement68 Annex B (informative) Examples of the uncertainty calculation in high-current measurements 76 Annex C (informative) Step-response measurements.82 Annex D (informative) Convolution method for estimation of dynamic behaviour from step-response measurements .
37、85 Annex E (informative) Constraints for certain wave shapes88 Annex F (informative) Temperature rise of measuring resistors90 Annex G (informative) Determination of r.m.s. values of short-time a.c. current .91 Annex H (informative) Examples of IEC standards with high current tests98 Bibliography100
38、 Figure 1 Examples of amplitude frequency responses for limit frequencies (f 1 ; f 2 ). 14 Figure 2 Calibration by comparison over full assigned measurement range22 Figure 3 Uncertainty contributions of the calibration (example with the minimum of 5 current levels).23 Figure 4 Calibration by compari
39、son over a limited current range with a linearity test (see 5.3) providing extension up to the largest value in the assigned measurement range24 Figure 5 Linearity test of the measuring system with a linear device in the extended voltage range26 Figure 6 Short-term stability test for steady-state cu
40、rrent. 28 Figure 7 Short-term stability test for impulse current and short-time current.28 Figure 8 Short-term stability test for periodic impulse-current and periodic short-time current29 Figure 9 Test circuit for effect of nearby current path for current-converting shunts and current transformers
41、with iron. .31 Figure 10 Test circuit for effect of nearby current path for inductive measuring systems without iron (Rogowski coils).31 Figure 11 Principle of interference test circuit. .37 Figure 12 Interference test on the measuring system i 1 (t) based on current-converting shunt or current tran
42、sformer with iron in a typical 3-phase short-circuit set-up (example). 37 Figure 13 Test circuit for interference test for inductive systems without iron. 38 Figure 14 Acceptable normalized amplitude-frequency response of an a.c. measuring system intended for a single fundamental frequency f nom. .4
43、5 Figure 15 Acceptable normalized amplitude-frequency response of an a.c. measuring system intended for a range of fundamental frequencies f nom1to f nom2 .46 Figure 16 Example of short-time direct current.48 Figure 17 Example of short-time alternating current. 52 Figure 18 Exponential impulse curre
44、nt. 58 Figure 19 Exponential impulse current oscillating tail. .58 Figure 20 Impulse current Rectangular, smooth. .59 6 62475 IEC:2010 Figure 21 Impulse current Rectangular with oscillations. .59 Figure A.1 Normal probability distribution p(x) of a continuous random variable x.75 Figure A.2 Rectangu
45、lar symmetric probability distribution p(x) of the estimate x of an input quantity X.75 Figure B.1 Comparison between the system under calibration X and the reference system N 81 Figure C.1 Circuit to generate current step using a coaxial cable. 82 Figure C.2 Circuit to generate current step using a
46、 capacitor. 82 Figure C.3 Definition of response parameters with respect to step response84 Figure E.1 Attainable combinations of time parameters (shaded area) for the 8/20 impulse at maximum 20 % undershoot and for 20 % tolerance on the time parameters .88 Figure E.2 Locus for limit of attainable t
47、ime parameters as a function of permissible undershoot for the 8/20 impulse89 Figure E.3 Locus for limit of attainable time parameters as a function of permissible undershoot for the 30/80 impulse89 Figure G.1 Equivalent circuit of short-circuit test91 Figure G.2 Symmetrical a.c. component of an alt
48、ernating short-circuit current .92 Figure G.3 Numerical evaluation of r.m.s value showing both instantaneous current and instantaneous squared value of the current93 Figure G.4 Three-crest method 94 Figure G.5 Evaluation of conventional r.m.s. value of an arc current using the three- crest method.95
49、 Figure G.6 Evaluation of equivalent r.m.s value of a short-time current during a short-circuit test96 Figure G.7 Relation between peak factor and power factor cos(). 97 Table 1 Required tests for steady-state direct current 40 Table 2 Required tests for ripple current 42 Table 3 Required tests for steady-state alternating current 46 Table 4 Tolerance re
