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    IEC 62321-3-1-2013 Determination of certain substances in electrotechnical products - Part 3-1 Screening test methods - Screening of electrotechnical products for lead mercury cadm.pdf

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    IEC 62321-3-1-2013 Determination of certain substances in electrotechnical products - Part 3-1 Screening test methods - Screening of electrotechnical products for lead mercury cadm.pdf

    1、 IEC 62321-3-1 Edition 1.0 2013-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Determination of certain substances in electrotechnical products Part 3-1: Screening Lead, mercury, cadmium, total chromium and total bromine by X-ray fluorescence spectrometry Dtermination de certaines substances dans le

    2、s produits lectrotechniques Partie 3-1: Mthodes dessai Plomb, du mercure, du cadmium, du chrome total et du brome total par la spectromtrie par fluorescence X IEC 62321-3-1:2013 colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2013 IEC, Geneva, Switzerland All rights reserved. Unless

    3、otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any

    4、 questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication

    5、ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous d

    6、sirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch Abou

    7、t the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review

    8、 by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Useful links: IEC publications search - www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical co

    9、mmittee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia

    10、- www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer S

    11、ervice Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et pu

    12、blie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amend

    13、ement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.ch/searchpub La recherche avance vous permet de trouver des publications CEI en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications

    14、remplaces ou retires. Just Published CEI - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications de la CEI. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionn

    15、aire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstor

    16、e.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 62321-3-1 Edition 1.0 2013-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Determination of certain substances in electrotechnical products Part 3-1: Screening L

    17、ead, mercury, cadmium, total chromium and total bromine by X-ray fluorescence spectrometry Dtermination de certaines substances dans les produits lectrotechniques Partie 3-1: Mthodes dessai Plomb, du mercure, du cadmium, du chrome total et du brome total par la spectromtrie par fluorescence X INTERN

    18、ATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE X ICS 13.020; 43.040.10 PRICE CODE CODE PRIX ISBN 978-2-83220-839-7 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure th

    19、at you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour inside 2 62321-3-1 IEC:2013 CONTENTS FOREWORD . 5 INTRODUCTION . 7 1 Scope . 8 2 Normative references . 10 3 Terms, definitions and

    20、 abbreviations 10 4 Principle . 10 Overview . 10 4.1Principle of test . 11 4.2Explanatory comments 11 4.3 5 Apparatus, equipment and materials . 12 XRF spectrometer . 12 5.1Materials and tools 12 5.2 6 Reagents 12 7 Sampling 12 General . 12 7.1Non-destructive approach 12 7.2Destructive approach. 12

    21、7.3 8 Test procedure . 13 General . 13 8.1Preparation of the spectrometer 13 8.2Test portion . 14 8.3Verification of spectrometer performance 14 8.4Tests . 15 8.5Calibration . 15 8.6 9 Calculations . 16 10 Precision 17 General . 17 10.1Lead 17 10.2Mercury . 17 10.3Cadmium . 17 10.4Chromium 18 10.5Br

    22、omine. 18 10.6Repeatability statement for five tested substances sorted by type of tested 10.7 material . 18 General . 18 10.7.1Material: ABS (acrylonitrile butadiene styrene), as granules and 10.7.2 plates 18 Material: PE (low density polyethtylene), as granules 19 10.7.3Material: PC/ABS (polycarbo

    23、nate and ABS blend), as granules . 19 10.7.4Material: HIPS (high impact polystyrene) . 19 10.7.5Material: PVC (polyvinyl chloride), as granules 19 10.7.6Material: Polyolefin, as granules 19 10.7.7Material: Crystal glass . 20 10.7.8Material: Glass 20 10.7.9Material: Lead-free solder, chips 20 10.7.10

    24、62321-3-1 IEC:2013 3 Material: Si/Al Alloy, chips . 20 10.7.11Material: Aluminum casting alloy, chips . 20 10.7.12Material: PCB Printed circuit board ground to less than 250 m 20 10.7.13Reproducibility statement for five tested substances sorted by type of tested 10.8 material . 20 General . 20 10.8

    25、.1Material: ABS (Acrylonitrile butadiene styrene), as granules and 10.8.2 plates 21 Material: PE (low density polyethtylene), as granules 21 10.8.3Material: PC/ABS (Polycarbonate and ABS blend), as granules . 21 10.8.4Material: HIPS (high impact polystyrene) . 21 10.8.5Material: PVC (polyvinyl chlor

    26、ide), as granules 22 10.8.6Material: Polyolefin, as granules 22 10.8.7Material: Crystal glass . 22 10.8.8Material: Glass 22 10.8.9Material: Lead-free solder, chips 22 10.8.10Material: Si/Al alloy, chips . 22 10.8.11Material: Aluminum casting alloy, chips . 22 10.8.12Material: PCB Printed circuit boa

    27、rd ground to less than 250 m 22 10.8.13 11 Quality control 23 Accuracy of calibration 23 11.1Control samples 23 11.2 12 Special cases . 23 13 Test report 23 Annex A (informative) Practical aspects of screening by X-ray fluorescence spectrometry (XRF) and interpretation of the results . 25 Annex B (i

    28、nformative) Practical examples of screening with XRF . 31 Bibliography 40 Figure B.1 AC power cord, X-ray spectra of sampled sections . 32 Figure B.2 RS232 cable and its X-ray spectra 33 Figure B.3 Cell phone charger shown partially disassembled . 34 Figure B.4 PWB and cable of cell phone charger .

    29、35 Figure B.5 Analysis of a single solder joint on a PWB 36 Figure B.6 Spectra and results obtained on printed circuit board with two collimators 36 Figure B.7 Examples of substance mapping on PWBs . 38 Figure B.8 SEM-EDX image of Pb free solder with small intrusions of Pb (size = 30 m) . 39 Table 1

    30、 Tested concentration ranges for lead in materials 8 Table 2 Tested concentration ranges for mercury in materials 9 Table 3 Tested concentration ranges for cadmium in materials . 9 Table 4 Tested concentration ranges for total chromium in materials 9 Table 5 Tested concentration ranges for total bro

    31、mine in materials 9 Table 6 Recommended X-ray lines for individual analytes 14 Table A.1 Effect of matrix composition on limits of detection of some controlled elements . 26 4 62321-3-1 IEC:2013 Table A.2 Screening limits in mg/kg for regulated elements in various matrices . 27 Table A.3 Statistical

    32、 data from IIS2 29 Table A.4 Statistical data from IIS4 30 Table B.1 Selection of samples for analysis of AC power cord . 32 Table B.2 Selection of samples (testing locations) for analysis after visual inspection Cell phone charger. 34 Table B.3 Results of XRF analysis at spots (1) and (2) as shown

    33、in Figure B.6 37 62321-3-1 IEC:2013 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ DETERMINATION OF CERTAIN SUBSTANCES IN ELECTROTECHNICAL PRODUCTS Part 3-1: Screening Lead, mercury, cadmium, total chromium and total bromine by X-ray fluorescence spectrometry FOREWORD 1) The International Electrotech

    34、nical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To thi

    35、s end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National

    36、Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO)

    37、in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from

    38、 all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be hel

    39、d responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any di

    40、vergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IE

    41、C marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual e

    42、xperts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IE

    43、C Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IE

    44、C Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62321-3-1 has been prepared by IEC technical committee 111: Environmental standardization for electrical and electronic products and systems.

    45、 The first edition of IEC 62321:2008 was a stand alone standard that included an introduction, an overview of test methods, a mechanical sample preparation as well as various test method clauses. This first edition of IEC 62321-3-1 is a partial replacement of IEC 62321:2008, forming a structural rev

    46、ision and generally replacing Clauses 6 and Annex D. Future parts in the IEC 62321 series will gradually replace the corresponding clauses in IEC 62321:2008. Until such time as all parts are published, however, IEC 62321:2008 remains valid for those clauses not yet re-published as a separate part. 6

    47、 62321-3-1 IEC:2013 The text of this standard is based on the following documents: FDIS Report on voting 111/298/FDIS 111/308/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in a

    48、ccordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 62321 series can be found on the IEC website under the general title: Determination of certain substances in electrotechnical products The committee has decided that the contents of this publication will remain unchanged u

    49、ntil the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the c


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