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    IEC 62129-1-2016 Calibration of wavelength optical frequency measurement instruments - Part 1 Optical spectrum analyzers《波长 逛拼测量仪器校准.第1部分 光谱分析仪》.pdf

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    IEC 62129-1-2016 Calibration of wavelength optical frequency measurement instruments - Part 1 Optical spectrum analyzers《波长 逛拼测量仪器校准.第1部分 光谱分析仪》.pdf

    1、 IEC 62129-1 Edition 1.0 2016-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Calibration of wavelength/optical frequency measurement instruments Part 1: Optical spectrum analyzers talonnage des appareils de mesure de longueur donde/appareil de mesure de la frquence optique Partie 1: Analyseurs de sp

    2、ectre optique IEC 62129-1:2016-01(en-fr) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2016 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, inc

    3、luding photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below

    4、 or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et

    5、les microfilms, sans laccord crit de lIEC ou du Comit national de lIEC du pays du demandeur. Si vous avez des questions sur le copyright de lIEC ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de lIEC de votre

    6、pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standa

    7、rds for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEC Catalogue - webstore.

    8、iec.ch/catalogue The stand-alone application for consulting the entire bibliographical information on IEC International Standards, Technical Specifications, Technical Reports and other documents. Available for PC, Mac OS, Android Tablets and iPad. IEC publications search - www.iec.ch/searchpub The a

    9、dvanced search enables to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Pu

    10、blished details all new publications released. Available online and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing 20 000 terms and definitions in English and French, with equivalent terms in 15 addit

    11、ional languages. Also known as the International Electrotechnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary 65 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issued since 2002. Some entries have bee

    12、n collected from earlier publications of IEC TC 37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de lIEC La Commission Electrote

    13、chnique Internationale (IEC) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications IEC Le contenu technique des publications IEC est constamment revu. Veuillez v

    14、ous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue IEC - webstore.iec.ch/catalogue Application autonome pour consulter tous les renseignements bibliographiques sur les Normes internationales, Spcifications techniques, Rapports techniques e

    15、t autres documents de lIEC. Disponible pour PC, Mac OS, tablettes Android et iPad. Recherche de publications IEC - www.iec.ch/searchpub La recherche avance permet de trouver des publications IEC en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des information

    16、s sur les projets et les publications remplaces ou retires. IEC Just Published - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications IEC. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.elec

    17、tropedia.org Le premier dictionnaire en ligne de termes lectroniques et lectriques. Il contient 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans 15 langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (IEV) en ligne. Glossaire I

    18、EC - std.iec.ch/glossary 65 000 entres terminologiques lectrotechniques, en anglais et en franais, extraites des articles Termes et Dfinitions des publications IEC parues depuis 2002. Plus certaines entres antrieures extraites des publications des CE 37, 77, 86 et CISPR de lIEC. Service Clients - we

    19、bstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 62129-1 Edition 1.0 2016-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Calibration of wavelength/optical frequency measurement instruments Part 1: Optical

    20、 spectrum analyzers talonnage des appareils de mesure de longueur donde/appareil de mesure de la frquence optique Partie 1: Analyseurs de spectre optique INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 33.140; 33.180.01 ISBN 978-2-8322-3123-4 Registered trade

    21、mark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. c

    22、olour inside 2 IEC 62129-1:2016 IEC 2016 CONTENTS FOREWORD . 5 1 Scope 7 2 Normative references 7 3 Terms and definitions 7 4 Preparation for calibration . 12 4.1 Organization . 12 4.2 Traceability . 12 4.3 Preparation . 12 4.4 Reference calibration conditions . 12 5 Wavelength calibration 13 5.1 Ov

    23、erview. 13 5.2 Wavelength calibration under reference conditions . 13 5.2.1 General . 13 5.2.2 Equipment for wavelength calibration under reference conditions 14 5.2.3 Procedure for wavelength calibration under reference conditions . 14 5.2.4 Calculations of wavelength uncertainty under reference co

    24、nditions 14 5.3 Wavelength calibration for operating conditions 15 5.3.1 General . 15 5.3.2 Wavelength dependence . 15 5.3.3 Temperature dependence 16 5.4 Calculation of expanded uncertainty . 17 6 Power level calibration . 18 6.1 Overview. 18 6.2 Power level calibration under reference conditions 1

    25、9 6.2.1 General . 19 6.2.2 Equipment for power level calibration under reference conditions 19 6.2.3 Procedure for power level calibration under reference conditions . 19 6.2.4 Calculation of power level uncertainty under reference conditions . 20 6.3 Power level calibration for operating conditions

    26、 21 6.3.1 General . 21 6.3.2 Wavelength dependence . 21 6.3.3 Polarization dependence . 23 6.3.4 Linearity 24 6.3.5 Temperature dependence 26 6.4 Calculation of expanded uncertainty . 27 7 Resolution bandwidth (spectral resolution) test 28 7.1 Overview. 28 7.2 Resolution bandwidth (spectral resoluti

    27、on) test . 28 7.2.1 General . 28 7.2.2 Equipment for resolution bandwidth (spectral resolution) test 28 7.2.3 Test procedure for resolution bandwidth (spectral resolution) 29 8 Documentation 30 8.1 Measurement conditions . 30 8.2 Measurement data and uncertainty . 30 Annex A (normative) Mathematical

    28、 basis . 31 IEC 62129-1:2016 IEC 2016 3 A.1 General . 31 A.2 Type A evaluation of uncertainty . 31 A.3 Type B evaluation of uncertainty . 32 A.4 Determining the combined standard uncertainty 32 A.5 Reporting 33 Annex B (informative) Examples of calculation of calibration uncertainty 34 B.1 General .

    29、 34 B.2 Wavelength calibration 34 B.2.1 Uncertainty under reference conditions: ref D u 34 B.2.2 Uncertainty under operating conditions 35 B.2.3 Expanded uncertainty calculation 36 B.3 Power level calibration 37 B.3.1 Uncertainty under reference conditions: ref P D u 37 B.3.2 Uncertainty under opera

    30、ting conditions 38 B.3.3 Expanded uncertainty calculation 41 Annex C (informative) Using the calibration results 42 C.1 General . 42 C.1.1 Overview . 42 C.1.2 Parameters 42 C.1.3 Restrictions . 42 C.2 Additive corrections 42 C.2.1 Parameters 42 C.2.2 Measurements close to a calibration reference wav

    31、elength 43 C.2.3 Measurements at other wavelengths 43 C.3 Multiplicative corrections . 44 C.3.1 Parameters 44 C.3.2 Measurements close to a calibration reference wavelength 44 C.3.3 Measurements at other wavelengths 44 C.4 OSA calibration results (additive correction) . 45 Annex D (informative) Wave

    32、length references . 48 D.1 General . 48 D.2 Gas laser lines 48 D.3 Noble gas reference lines . 48 D.4 Molecular absorption lines 49 Bibliography 53 Figure 1 Setup using a gas laser whose wavelength is known 13 Figure 2 Setup using a broadband source with a transmission device 13 Figure 3 Setup using

    33、 an LD with an unknown wavelength 13 Figure 4 Test configuration for determining the temperature dependence of wavelength uncertainty . 17 Figure 5 Setup for calibration of power level under reference conditions 19 Figure 6 Test configuration for determining the wavelength dependence of power level

    34、uncertainty . 21 Figure 7 Test configuration for determining the polarization dependence of power level uncertainty . 23 Figure 8 Configuration for testing linearity error of power level uncertainty 24 4 IEC 62129-1:2016 IEC 2016 Figure 9 Test configuration for determining the temperature dependence

    35、 of power level uncertainty . 26 Figure C.1 Calibration of OSA wavelength scale using krypton emission lines; 95 % confidence intervals shown . 47 Figure D.1 Absorption of LED light by acetylene ( 12 C 2 H 2 ) 50 Figure D.2 Absorption of LED light by hydrogen cyanide (H 13 C 14 N) . 52 Table 1 Recom

    36、mended light sources . 29 Table C.1 OSA calibration results 46 Table C.2 Summary of OSA calibration parameters 46 Table D.1 Vacuum wavelengths (nm) of selected gas laser lines 48 Table D.2 Vacuum wavelengths (nm) of noble gas reference lines . 49 Table D.3 Vacuum wavelengths (nm) for the 1 + 3band o

    37、f acetylene 12 C 2 H 2absorption lines 21-23 50 Table D.4 Vacuum wavelengths (nm) for the 1 + 3band of acetylene 13 C 2 H 2absorption lines 21-23 51 Table D.5 Vacuum wavelengths (nm) of selected hydrogen cyanide (H 13 C 14 N) absorption lines 24 . 51 IEC 62129-1:2016 IEC 2016 5 INTERNATIONAL ELECTRO

    38、TECHNICAL COMMISSION _ CALIBRATION OF WAVELENGTH/OPTICAL FREQUENCY MEASUREMENT INSTRUMENTS Part 1: Optical spectrum analyzers FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC Natio

    39、nal Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Public

    40、ly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governm

    41、ental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on

    42、technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted

    43、by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international u

    44、niformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.

    45、 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should e

    46、nsure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage o

    47、f any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the

    48、referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. I

    49、nternational Standard IEC 62129-1 has been prepared by IEC technical committee 86: Fibre optics. This first edition of IEC 62129-1 cancels and replaces the first edition of IEC 62129, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) update of term and definitions; b) update of cal


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