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    IEC 61967-8-2011 Integrated circuits - Measurement of electromagnetic emissions - Part 8 Measurement of radiated emissions - IC stripline method《集成电路的电磁辐射测量.第8部分 IC带状线法测量辐射干扰》.pdf

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    IEC 61967-8-2011 Integrated circuits - Measurement of electromagnetic emissions - Part 8 Measurement of radiated emissions - IC stripline method《集成电路的电磁辐射测量.第8部分 IC带状线法测量辐射干扰》.pdf

    1、 IEC 61967-8 Edition 1.0 2011-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Integrated circuits Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions IC stripline method Circuits intgrs Mesure des missions lectromagntiques Partie 8: Mesure des missions rayonnes Mthode d

    2、e la ligne TEM plaques (stripline) pour CI IEC 61967-8:2011 colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic

    3、 or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contac

    4、t the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compri

    5、s la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit n

    6、ational de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards

    7、for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications

    8、: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IE

    9、C publications. Just Published details twice a month all new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French,

    10、 with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ

    11、or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologi

    12、es apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm

    13、Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform su

    14、r les nouvelles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 t

    15、ermes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette

    16、 publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61967-8 Edition 1.0 2011-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Integrated circuits Measurement of electromagnetic emissions Part

    17、8: Measurement of radiated emissions IC stripline method Circuits intgrs Mesure des missions lectromagntiques Partie 8: Mesure des missions rayonnes Mthode de la ligne TEM plaques (stripline) pour CI INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE Q ICS 31.200 PR

    18、ICE CODE CODE PRIX ISBN 978-2-88912-619-4 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale colour inside 2 61967-8 IEC:2011 CONTENTS FOREWORD . 3 1 Scope . 5 2 Normative references . 5 3 Terms and definitions . 5 4 Ge

    19、neral 6 5 Test conditions . 6 5.1 General . 6 5.2 Supply voltage. 6 5.3 Frequency range . 6 6 Test equipment . 7 6.1 General . 7 6.2 RF measuring instrument 7 6.3 Preamplifier . 7 6.4 IC stripline . 7 6.5 50 termination 7 6.6 System gain 7 7 Test set-up . 8 7.1 General . 8 7.2 Test configuration 8 7

    20、.3 EMC test board (PCB) . 8 8 Test procedure . 9 8.1 General . 9 8.2 Ambient conditions 9 8.3 Operational check . 9 8.4 Verification of IC stripline RF characteristic . 9 8.5 Test technique. 9 9 Test report 10 9.1 General . 10 9.2 Measurement conditions 10 10 IC Emissions reference levels. 10 Annex

    21、A (normative) IC stripline description. 11 Annex B (informative) Specification of emission levels . 15 Bibliography 17 Figure 1 IC stripline test set-up 8 Figure A.1 Cross section view of an example of an unshielded IC stripline . 11 Figure A.2 Cross section view of an example of an IC stripline wit

    22、h housing 12 Figure A.3 Example of IC stripline with housing . 14 Figure B.1 Emission characterization levels . 16 Table A.1 Maximum DUT dimensions for 6,7 mm IC stripline open version 12 Table A.2 Maximum DUT dimensions for 6,7 mm IC stripline closed version 12 61967-8 IEC:2011 3 INTERNATIONAL ELEC

    23、TROTECHNICAL COMMISSION _ INTEGRATED CIRCUITS MEASUREMENT OF ELECTROMAGNETIC EMISSIONS Part 8: Measurement of radiated emissions IC stripline method FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnica

    24、l committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Te

    25、chnical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, govern

    26、mental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions o

    27、r agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for internationa

    28、l use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to

    29、promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly i

    30、ndicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies

    31、. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property d

    32、amage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this p

    33、ublication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or al

    34、l such patent rights. International Standard IEC 61967-8 has been prepared by subcommittee 47A: Integrated circuits, of IEC technical committee 47: Semiconductor devices. The text of this standard is based on the following documents: FDIS Report on voting 47A/868/FDIS 47A/870/RVD Full information on

    35、 the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 4 61967-8 IEC:2011 This part of IEC 61967 is to be read in conjunction with IEC 61967-1. A list of all

    36、 parts of IEC 6xxxx series, under the general title Integrated circuits Measurement of electromagnetic emissions can be found on the IEC website. NOTE Future standards in this series will carry the new general title as cited above. Titles of existing standards in this series will be updated at the t

    37、ime of the next edition. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, with

    38、drawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour print

    39、er. 61967-8 IEC:2011 5 INTEGRATED CIRCUITS MEASUREMENT OF ELECTROMAGNETIC EMISSIONS Part 8: Measurement of radiated emissions IC stripline method 1 Scope The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circui

    40、t (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. 2 Normative references The following referenced documents are indispensable for

    41、the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-131: International Electrotechnical Vocabulary (IEV) Part 131: Circuit theory IEC 60050-161: Int

    42、ernational Electrotechnical Vocabulary (IEV) Chapter 161: Electro- magnetic compatibility IEC 61967-1: Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 1: General conditions and definitions IEC 61967-2: Integrated circuits Measurement of electromagnetic emissions,

    43、150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method IEC 61000-4-20: Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides 3 Terms and definitions For

    44、the purposes of this document, the terms and definitions given in IEC 61967-1, IEC 60050-131 and IEC 60050-161 as well as the following apply. 3.1 transverse electromagnetic (TEM) mode waveguide mode in which the components of the electric and magnetic fields in the propagation direction are much le

    45、ss than the primary field components across any transverse cross-section 3.2 TEM waveguide open or closed transmission line system, in which a wave is propagating in the transverse electromagnetic mode to produce a specified field for testing purposes 6 61967-8 IEC:2011 3.3 IC stripline TEM waveguid

    46、e, consisting of an active conductor placed on a defined spacing over an enlarged ground plane, connected to a port structure on each end and an optional shielded enclosure NOTE This arrangement guides a wave propagation in the transverse electromagnetic mode to produce a specific field for testing

    47、purposes between the active conductor and the enlarged ground plane. As enlarged ground plane the ground plane of the standard EMC test board according to IEC 61967-1 should be used. An optional shielding enclosure may be used for fixing the IC stripline configuration and for shielding purposes. Thi

    48、s leads to a closed version of the IC stripline in opposite to the open version without shielding enclosure. For further information see Annex A. 3.4 two-port TEM waveguide TEM waveguide with input/output measurement ports at both ends 3.5 characteristic impedance magnitude of the ratio of the volta

    49、ge between the active conductor and the corresponding ground plane to the current on either conductor for any constant phase wave-front NOTE The characteristic impedance is independent of the voltage/current magnitudes and depends only on the cross sectional geometry of the transmission line. TEM waveguides are typically designed to have 50 characteristic imp


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