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    IEC 61580-1-1996 Methods of measurement for waveguides - Part 1 Decoupling and rotation of the plane of polarization《波导测量方法 第1部分 偏振面的退耦和旋转》.pdf

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    IEC 61580-1-1996 Methods of measurement for waveguides - Part 1 Decoupling and rotation of the plane of polarization《波导测量方法 第1部分 偏振面的退耦和旋转》.pdf

    1、NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 1580-1 Premire dition First edition 1996-06 Mthodes de mesure appliques aux guides d?ondes - Partie 1 : Dcouplage et rotation du plan de polarisation Methods of measurement for waveguides - Part 1: Decoupling and rotation of the plane of polarizati

    2、on Numro de rfrence Reference number CEMEC 1580-1 : 1996 Numros des publications Depuis le ler janvier 1997, les publications de la CE1 sont numrotes partir de 60000. Publications consolides Les versions consolides de certaines publications de la CE1 incorporant les amendements sont disponibles. Par

    3、 exemple, les numros ddition 1.0, 1.1 et 1.2 indiquent respectivement la publication de base, la publication de base incorporant lamendement 1, et la publication de base incorporant les amendements 1 et 2. Validit de la prsente publication Le contenu technique des publications de la CE1 est constamm

    4、ent revu par la CE1 afin quil reflte ltat actuel de la technique. Des renseignements relatifs la date de reconfir- mation de la publication sont disponibles dans le Catalogue de la CEI. Les renseignements relatifs des questions ltude et des travaux en cours entrepris par le comit technique qui a tab

    5、li cette publication, ainsi que la liste des publications tablies, se trouvent dans les documents ci- dessous: Site web de la CEI* Catalogue des pubtications de la CE1 Publi annuellement et mis jour rgulirement (Catalogue en ligne)* Disponible la fois au site web de la CEI* et comme priodique imprim

    6、 Bulletin de la CE1 Terminologie, symboles graphiques et littraux En ce qui concerne la terminologie gnrale, le lecteur se reportera la CE1 60050: Vocabulaire Electro- technique International (VEI). Pour les symboles graphiques, les symboles littraux et les signes dusage gnral approuvs par la CEI, l

    7、e lecteur consultera la CE1 60027: Symboles littraux a utiliser en lectrotechnique, la CE1 6041 7: Symboles graphiques utilisables sur le matriel. Index, relev et compilation des feuilles individuelles, et la CE1 6061 7: Symboles graphiques pour schmas. * Voir adresse site web, sur la page de titre.

    8、 Numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. Consolidated publications Consolidated versions of some IEC publications including amendments are available. For example, edition numbers 1 .O, 1.1 and 1.2 refer, respectively, to the base publi

    9、cation, the base publication incor- porating amendment 1 and the base publication incorporating amendments 1 and 2. Validity of this publication The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Information

    10、 relating to the date of the reconfirmation of the publication is available in the IEC catalogue. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is to be found

    11、 at the following IEC sources: IEC web site“ Catalogue of IEC publications Published yearly with regular updates (On-line catalogue)* Available both at the IEC web site* and as a printed periodical IEC Bulletin Terminology, graphical and letter symbols For general terminology, readers are referred t

    12、o I EC 60050: International Electrotechnical Vocabulary (IEV). For graphical symbols, and letter symbols and signs approved by the IEC for general use, readers are referred to publications IEC 60027: Letter symbols to be used in electrical technology, IEC 60417: Graphical symbols for use on equipmen

    13、t. Index, survey and compilation of the single sheets and IEC 60617: Graphical symbols for diagrams. See web site address on title page. NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 1580-1 Premiere dition First edition 1996-06 Mthodes de mesure appliques aux guides dondes - Partie 1 : Dcoupla

    14、ge et rotation du plan de polarisation Methods of measurement for waveguides - Part 1: Decoupling and rotation of the plane of polarization O CE1 1996 Droits de reproduction reserves - Copyright - all rights resewed Aucune partie de cette publication ne peut tre reproduite ni No part of this publica

    15、tion may be reproduced or utilized utilise sous quelque forme que ce soit et par aucun procd, in any form or by any means, electronic or mechanical. lectronique ou mcanique, y compris la photocopie et les including photocopying and microfilm. without microfilms. sans laccord crit de lditeur. permiss

    16、ion in writing from the publisher Bureau central de la Commission Electrotechnique Internationale 3, rue de Varem any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the

    17、 IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. The formal decisions or agreements of the IEC on technical matters, express as ne

    18、arly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested National Committees. The documents produced have the form of recommendations for international use and are published in the form of standards, techni

    19、cal reports or guides and they are accepted by the National Committees in that sense. In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and regional standards. Any diver

    20、gence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with one of its standards. Att

    21、ention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. 2) 3) 4) 5) 6) International Standard IEC 1580-1 has been prepared by subcommittee 46B: Wa

    22、veguides and their accessories, of IEC technical committee 46: Cables, wires, waveguides, r.f. connectors, and accessories for communication and signalling. The text of this standard is based on the following documents: Full information on the voting for the approval of this standard can be found in

    23、 the report on voting indicated in the above table. -6- 1580-1 O CEI:1996 MTHODES DE MESURE APPLIQUES AUX GUIDES DONDES - Partie 1 : Dcouplage et rotation du plan de polarisation 1 Domaine dapplication La prsente partie de la GEI 1580 est applicable aux guides dondes pouvant propager deux polarisati

    24、ons orthogonales dun mme mode, de sorte que la section du guide est gnralement carre ou circulaire. On peut galement considrer dautres types plus sophistiqus, comme les guides dondes section octogonale. Lobjet des trois procdures dessai donnes ci-aprs est de caractriser les proprits de polarisation

    25、croise des guides dondes. Lorsquun mode unique de polarisation est gnr lentre dun guide dondes lessai, des imperfections gomtriques produisent une dpolarisation lors de la propagation du signal le long du guide. Cette dpolarisation limitera les possibilits du guide maintenir deux polarisations indpe

    26、ndantes. II est donc ncessaire de mesurer dans le guide lessai la polarisation croise gnre. Les procdures de mesure essaient datteindre ce but. Les mthodes dessai peuvent tre utilises sur des assemblages de guides ou un simple guide. II est possible de pratiquer les essais non seulement au laboratoi

    27、re mais galement sur site. Trois procdures sont dcrites brivement, incluant: a) La procdure de mesure du dcouplage, dfinie comme le niveau de signal orthogonal polaris rflchi par le guide dondes lessai ferm sur une charge adapte. b) La procdure de mesure du niveau de polarisation croise, lorsquun si

    28、gnal de polarisation unique est inject dans le guide dondes lessai. c) La procdure de mesure pour dfinir langle effectif de rotation du champ lectrique dans le guide lessai. 2 Mesure de decouplage 2.1 Princip e La procdure dessai consiste injecter un signal de polarisation dfinie, dans ce guide dond

    29、es lessai. Le dcouplage est le niveau du signal qui est rflchi en polarisation orthogonale dun transducteur, appel souvent un duplexeur de polarisation, li au signal dentre. Il est possible deffectuer les mesures avec des frquences simples ou de balayage. 2.2 Equipement dessai Lquipement dessai est

    30、indiqu la figure 1. 1580-1 O IEC:1996 - 7- METHODS OF MEASUREMENT FOR WAVEGUIDES - Part 1 : Decoupling and rotation of the plane of polarization 1 Scope This part of IEC 1580 is applicable to waveguides which can propagate two orthogonal polarizations of the same waveguide mode. In this way, the wav

    31、eguide type is generally restricted to square or circular cross-section, such as waveguide with an octagonal cross- section. The objective of the three test procedures given below is to characterize the cross-polar properties of waveguides. When a single mode of defined polarization is generated at

    32、the source end of the waveguide under test, geometrical imperfections will induce a depolarization to occur as the signal propagates along the waveguide. This depolarization will be a limiting factor on the usefulness of the waveguide in supporting two independent polarizations. As a result, it is n

    33、ecessary to quantify the generated cross-polarization in the waveguide under test. The measurement procedures attempt to do just that. Testing can be performed on waveguide runs or on a single waveguide. Tests may be performed in the field not just in the laboratory. Three procedures are briefly des

    34、cribed, which include the following: a) Measurement procedure for the decoupling, defined as the orthogonally polarized signal level reflected from the waveguide under test when terminated with a matched load. b) Measurement procedure for the generated cross-polarized level when a single polarizatio

    35、n signal is injected into a waveguide under test. c) Measurement procedure for establishing the effective angle of rotation of the electric field in the waveguide under test. 2 Measurement of decoupling 2.1 Principle The test procedure consists of injecting a signal with a defined polarization into

    36、the waveguide under test. The decoupling is the level of the signal that is reflected back into the orthogonal polarization of an orthomode transducer, often called a polarization duplexer, relative to the input signal. Either single or swept frequency measurements can be made. 2.2 Test equipment The test equipment is set up as shown in figure 1.


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