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    IEC 61300-3-44-2012 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-44 Examinations and measurements - Fibre optic tranc.pdf

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    IEC 61300-3-44-2012 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-44 Examinations and measurements - Fibre optic tranc.pdf

    1、 IEC 61300-3-44 Edition 1.0 2012-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 3-44: Examinations and measurements Fibre optic transceiver receptacle endface visual and automated inspection Disposi

    2、tifs dinterconnexion et composants passifs fibres optiques Mthodes fondamentales dessais et de mesures Partie 3-44: Examens et mesures Inspection automatique et visuelle de lextrmit des embases dmetteurs-rcepteurs fibres optiques IEC61300-3-44:2012 colourinsideTHIS PUBLICATION IS COPYRIGHT PROTECTED

    3、 Copyright 2012 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs membe

    4、r National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction r

    5、servs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeu

    6、r. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41

    7、22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications Th

    8、e technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Useful links: IEC publications search - www.iec.ch/searchpub The advanced search enables you to find IEC public

    9、ations by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications rele

    10、ased. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as th

    11、e International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Inter

    12、nationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous ass

    13、urer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.ch/searchpub La recherche avance vous permet de trouver des publications CEI en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). E

    14、lle donne aussi des informations sur les projets et les publications remplaces ou retires. Just Published CEI - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications de la CEI. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mo

    15、is par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Ele

    16、ctrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 61300-3-44 Edition 1.0 2012-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre optic inte

    17、rconnecting devices and passive components Basic test and measurement procedures Part 3-44: Examinations and measurements Fibre optic transceiver receptacle endface visual and automated inspection Dispositifs dinterconnexion et composants passifs fibres optiques Mthodes fondamentales dessais et de m

    18、esures Partie 3-44: Examens et mesures Inspection automatique et visuelle de lextrmit des embases dmetteurs-rcepteurs fibres optiques INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE N ICS 33.180.20 PRICE CODE CODE PRIX ISBN 978-2-83220-214-2 Registered trademark

    19、of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour

    20、inside 2 61300-3-44 IEC:2012 CONTENTS FOREWORD . 3 1 Scope . 5 2 Measurement 5 2.1 General . 5 2.2 Measurement conditions 6 2.3 Pre-conditioning. 6 2.4 Recovery . 6 3 Apparatus . 6 3.1 Method A: video microscopy 6 3.2 Method B: automated analysis microscopy . 6 3.3 Calibration requirements for low a

    21、nd high resolution systems . 6 3.3.1 General . 6 3.3.2 Requirements for low resolution microscope systems . 7 3.3.3 Requirements for high resolution microscope systems 7 4 Procedure . 7 4.1 Measurement regions 7 4.2 Calibration procedure 7 4.3 Inspection procedure . 8 4.4 Visual Requirements 10 Anne

    22、x A (normative) Diagram of calibration artefact and method of manufacture 11 Bibliography 14 Figure 1 Inspection procedure flow . 9 Figure A.1 Example of nano-indentation test system . 11 Figure A.2 Example of high resolution artefact: Sample of pattern cut into a 125 m cladding on the end of a poli

    23、shed SC connector . 12 Figure A.3 Example of low resolution artefact pattern 13 Table 1 Measurement regions 7 Table 2 Visual requirements for fibre receptacle interface equipped with transceivers 10 61300-3-44 IEC:2012 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FIBRE OPTIC INTERCONNECTING DEVICES

    24、 AND PASSIVE COMPONENTS BASIC TEST AND MEASUREMENT PROCEDURES Part 3-44: Examinations and measurements Fibre optic transceiver receptacle endface visual and automated inspection FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

    25、 all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards,

    26、 Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparator

    27、y work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organization

    28、s. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of reco

    29、mmendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by a

    30、ny end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional pu

    31、blication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by inde

    32、pendent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any

    33、 personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normativ

    34、e references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsib

    35、le for identifying any or all such patent rights. International Standard IEC 61300-3-44 has been prepared by subcommittee 86B: Fibre optic interconnecting devices and passive components, of IEC technical committee 86: Fibre optics. The text of this standard is based on the following documents: FDIS

    36、Report on voting 86B/3424/FDIS 86B/3467/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. 4 61300-3-44 IEC:2012 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all par

    37、ts of IEC 61300 series, published under the general title Fibre optic interconnecting devices and passive components Basic test and measurement procedures, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date

    38、indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. This document is withdrawn when IEC 61300-3-35 Edition 2.0 is published. IMPORTANT The

    39、 colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 61300-3-44 IEC:2012 5 FIBRE OPTIC INTERCONNECTING DEVICES A

    40、ND PASSIVE COMPONENTS BASIC TEST AND MEASUREMENT PROCEDURES Part 3-44: Examinations and measurements Fibre optic transceiver receptacle endface visual and automated inspection 1 Scope This part of IEC 61300 describes methods for quantitatively assessing the endface quality of an optic receptacle int

    41、erface for single mode applications, equipped with transceivers such as SFP/XFP. Lens type and stub ferrule type interface configurations are designed for this interface, but this standard defines the end face quality of the stub ferrule type in this edition. The information is intended for use with

    42、 other standards which set requirements for allowable surface defects such as scratches, pits and debris which may affect optical performance. In general, the methods described in this standard apply to 125 m cladding fibres contained within a ferrule and intended for use with sources of 2 W of inpu

    43、t power. 2 Measurement 2.1 General The objective of this document is to prescribe methods for quantitatively inspecting fibre optic endfaces to determine if they are suitable for use. Two methods are described: A: video microscopy and B: automated analysis microscopy. Within each method, there are h

    44、ardware requirements and procedures for both low resolution and high resolution systems. High resolution systems are to be utilized for critical examination of the glass fibre after polishing and upon incoming quality assurance. High resolution systems are typically not used during field polishing o

    45、r in conjunction with multimode connectors. Low resolution systems are to be utilized prior to mating connectors for any purpose. All methods require a means for measuring and quantifying defects. There are many types of defects. Commonly used terminology would include: particles, pits, chips, scrat

    46、ches, embedded debris, loose debris, cracks, etc. For practical purposes, all defects will be categorized in one of two groups. They are defined as follows: scratches: permanent linear surface features; defects: all non-linear features detectable on the fibre. This includes particulates, other debri

    47、s, pits, chips, edge chipping, etc. All defects and scratches are surface anomalies. Sub-surface cracks and fractures are not reliably detectable with a light microscope in all situations and are therefore not covered within this standard. Cracks and fractures to the fibre may be detected with a lig

    48、ht microscope and are generally considered a catastrophic failure. Differentiating between a scratch and all other defects is generally intuitive to a human being. However, to provide clarity, and for automated systems, scratches are defined as being less than 4 m wide, linear in nature, and with a

    49、length that is at least 30 times their width. As the width dimension is not practical to measure below 3 m, these figures can be grossly estimated. Defects size is defined for method A as the diameter of the smallest circle that can encompass the entire defect. Defect size for method B can be either the actual measured surface area or 6 61300-3-44 IEC:2012 the diameter of the smallest ci


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