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    IEC 61124-2012 Reliability testing - Compliance tests for constant failure rate and constant failure intensity《可靠性试验.恒定失效率和恒定失效强度的符合性试验》.pdf

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    IEC 61124-2012 Reliability testing - Compliance tests for constant failure rate and constant failure intensity《可靠性试验.恒定失效率和恒定失效强度的符合性试验》.pdf

    1、 IEC 61124 Edition 3.0 2012-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Reliability testing Compliance tests for constant failure rate and constant failure intensity Essais de fiabilit Plan dessais de conformit dun taux de dfaillance constant et dune intensit de dfaillance constante IEC 61124:201

    2、2 colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2012 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, with

    3、out permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Comm

    4、ittee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la

    5、 CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central O

    6、ffice Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electro

    7、nic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Useful links: IEC publications search - www.iec.ch/searc

    8、hpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publica

    9、tions. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equ

    10、ivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch.

    11、A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publica

    12、tions de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.ch/searchpub La recherche avance vous permet de trouver des publications CEI en utilisant diffre

    13、nts critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. Just Published CEI - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications de la CEI. Just Published dtaille les nouvelles publicatio

    14、ns parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les

    15、langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 61124 Edition 3.0 2012-05 INTERNATIO

    16、NAL STANDARD NORME INTERNATIONALE Reliability testing Compliance tests for constant failure rate and constant failure intensity Essais de fiabilit Plan dessais de conformit dun taux de dfaillance constant et dune intensit de dfaillance constante INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION E

    17、LECTROTECHNIQUE INTERNATIONALE XF ICS 03.120.30; 19.020; 21.020 PRICE CODE CODE PRIX ISBN 978-2-88912-061-1 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from a

    18、n authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour inside 2 61124 IEC:2012 CONTENTS FOREWORD . 8 1 Scope . 10 2 Normative references . 10 3 Terms, definitions, abbreviations and symbols 11 3.1 Terms and definitions 11 3.2

    19、 Abbreviations and symbols 11 3.2.1 Abbreviations 11 3.2.2 Symbols 11 4 General requirements and area of application 13 4.1 Requirements 13 4.2 Applicability to replaced and repaired items . 13 4.3 Types of test plans 13 4.3.1 General . 13 4.3.2 Advantages and disadvantages of the different test pla

    20、n types 14 5 General test procedure . 14 5.1 Test conditions 14 5.2 General characteristics of the test plans 15 5.3 Data to be recorded . 15 5.4 Calculation of accumulated test time, * T 15 5.5 Number of failures . 16 6 Sequential test plans 17 6.1 General . 17 6.2 Common test procedure 17 6.3 Deci

    21、sion criteria 17 6.4 Overview of test plans . 17 7 Fixed time/failure terminated test plans Fixed duration test plans 18 7.1 General . 18 7.2 Common test procedure 18 7.3 Decision criteria 19 7.4 Test plans . 19 8 Design of alternative time/failure terminated test plans . 20 8.1 General . 20 8.2 Des

    22、ign procedures 20 8.3 Common test procedure 20 8.4 Decision criteria 21 9 Calendar time/failure terminated test plans for non-replaced items . 21 9.1 General . 21 9.2 Common test procedure 21 9.3 Decision criteria 21 9.4 Use of Table 2 of IEC 61123:1991 for fixed calendar time tests . 22 9.4.1 Gener

    23、al . 22 9.4.2 Procedure when the test time is given . 22 9.4.3 Procedure when the number of items is given 22 10 Combined test plans . 23 61124 IEC:2012 3 10.1 General . 23 10.2 Common test procedure 23 10.3 Decision criteria 23 10.4 Test plans . 24 11 Performing the test . 24 12 Presentation of res

    24、ults 24 Annex A (normative) Tables and graphs for sequential test plans 25 Annex B (normative) Graphs for fixed time/failure terminated test plans . 44 Annex C (normative) Graphs for alternative time/failure terminated test plans 53 Annex D (normative) Tables and graphs for combined test plans and a

    25、dditional sequential test plans . 60 Annex E (informative) Examples and mathematical references for sequential test plans 78 Annex F (informative) Design of sequential test plans using a common spreadsheet program 86 Annex G (informative) Examples and mathematical references for fixed time/failure t

    26、erminated test plans Fixed duration test plans 97 Annex H (informative) Design of fixed duration time/failure terminated test plans using a spreadsheet program . 99 Annex I (informative) Examples and mathematical references for the design of alternative time/failure terminated test plans . 105 Annex

    27、 J (informative) Examples and mathematical references for the calendar time terminated test plans 112 Annex K (informative) Derivation and mathematical reference for the optimized test plans of GOST R 27 402 . 114 Bibliography 122 Figure A.1 Accept and reject lines for test plan A.1 25 Figure A.2 Te

    28、st plan A.1 Operating characteristic curve 26 Figure A.3 Test plan A.1 Expected accumulated test time to decision . 27 Figure A.4 Accept and reject lines for test plan A.2 27 Figure A.5 Test plan A.2 Operating characteristic curve 28 Figure A.6 Test plan A.2 Expected accumulated test time to decisio

    29、n . 29 Figure A.7 Accept and reject lines for test plan A.3 29 Figure A.8 Test plan A.3 Operating characteristic curve 30 Figure A.9 Test plan A.3 Expected accumulated test time to decision . 31 Figure A.10 Accept and reject lines for test plan A.4 31 Figure A.11 Test plan A.4 Operating characterist

    30、ic curve 32 Figure A.12 Test plan A.4 Expected accumulated test time to decision . 33 Figure A.13 Accept and reject lines for test plan A.5 33 Figure A.14 Test plan A.5 Operating characteristic curve 34 Figure A.15 Test plan A.5 Expected accumulated test time to decision . 35 Figure A.16 Accept and

    31、reject lines for test plan A.6 35 Figure A.17 Test plan A.6 Operating characteristic curve 36 Figure A.18 Test plan A.6 Expected accumulated test time to decision . 37 Figure A.19 Accept and reject lines for test plan A.7 37 4 61124 IEC:2012 Figure A.20 Test plan A.7 Operating characteristic curve 3

    32、8 Figure A.21 Test plan A.7 Expected accumulated test time to decision . 39 Figure A.22 Accept and reject lines for test plan A.8 40 Figure A.23 Test plan A.8 Operating characteristic curve 41 Figure A.24 Test plan A.8 Expected accumulated test time to decision . 41 Figure A.25 Accept and reject lin

    33、es for test plan A.9 42 Figure A.26 Test plan A.9 Operating characteristic curve 43 Figure A.27 Test plan A.9 Expected accumulated test time to decision . 43 Figure B.1 Operating characteristic curves for test plans B.1, B.2, B.3 and B.4 44 Figure B.2 Test plan B.1 Expected test time to decision 45

    34、Figure B.3 Test plan B.2 Expected test time to decision 45 Figure B.4 Test plan B.3 Expected test time to decision 46 Figure B.5 Test plan B.4 Expected test time to decision 46 Figure B.6 Operating characteristic curves for test plans B.5, B.6, B.7 and B.8 47 Figure B.7 Test plan B.5 Expected test t

    35、ime to decision 47 Figure B.8 Test plan B.6 Expected test time to decision 48 Figure B.9 Test plan B.7 Expected test time to decision 48 Figure B.10 Test plan B.8 Expected test time to decision 49 Figure B.11 Operating characteristic curves for test plans B.9, B.10 and B.11 . 49 Figure B.12 Test pla

    36、n B.9 Expected test time to decision 50 Figure B.13 Test plan B.10 Expected test time to decision 50 Figure B.14 Test plan B.11 Expected test time to decision . 51 Figure B.15 Operating characteristic curves for test plans B.12 and B.13. 51 Figure B.16 Test plan B.12 Expected test time to decision 5

    37、2 Figure B.17 Test plan B.13 Expected test time to decision 52 Figure C.1 Discrimination ratio, D, and the acceptable number of failures, c = 0 to 8, as a function of the expected number of failures, 0 , for recommended values, 2,5 %, 5 %, 10 %, 20 %, and 30 % of = 56 Figure C.2 Operation characteri

    38、stic curves for c = 0 to 8; probability of acceptance P a as a function of the (unknown) true expected number of failures, 057 Figure C.3 Discrimination ratio, D, as a function of the expected number of failures, 0 , for recommended values, 2,5 %, 5 %, 10 %, 15 %, 20 % and 30 % of = 58 Figure C.4 Ac

    39、ceptable number of failures, c, minus expected number of failures, 0 ( 0= c 0 ) as a function of the expected number of failures 0 for recommended values 2,5 %, 5 %, 10 %, 20 %, and 30 % of = 59 Figure D.1 Accept and reject lines . 61 Figure D.2 Expected test time to decision e T . 62 Figure D.3 Exp

    40、ected test time to decision of acceptance e T (+) 62 Figure D.4 Operating characteristic P a. 62 Figure D.5 Accept and reject lines . 63 Figure D.6 Expected test time to decision e T 64 Figure D.7 Expected test time to decision of acceptance ) (+ e T 64 Figure D.8 Operating characteristic P a. 64 61

    41、124 IEC:2012 5 Figure D.9 Accept and reject lines . 65 Figure D.10 Expected test time to decision e T . 66 Figure D.11 Expected test time to decision of acceptance ) (+ e T . 66 Figure D.12 Operating characteristic P a. 67 Figure D.13 Accept and reject lines . 68 Figure D.14 Expected test time to de

    42、cision e T . 69 Figure D.15 Expected test time to decision of acceptance ) (+ e T . 69 Figure D.16 Operating characteristic P a. 69 Figure D.17 Accept and reject lines . 70 Figure D.18 Expected test time to decision e T 71 Figure D.19 Expected test time to decision of acceptance ) (+ e T. 71 Figure

    43、D.20 Operating characteristic P a. 71 Figure D.21 Accept and reject lines . 72 Figure D.22 Expected test time to decision e T . 73 Figure D.23 Expected test time to decision of acceptance ) (+ e T 73 Figure D.24 Operating characteristic P a. 73 Figure D.25 Accept and reject lines . 74 Figure D.26 Ex

    44、pected test time to decision e T 74 Figure D.27 Expected test time to decision of acceptance ) (+ e T 74 Figure D.28 Operating characteristic P a. 75 Figure D.29 Accept and reject lines . 75 Figure D.30 Expected test time to decision * e T 76 Figure D.31 Expected test time to decision of acceptance

    45、) (+ e T 76 Figure D.32 Operating characteristic P a. 76 Figure E.1 Example of a sequential test using test plan A.3 = = 10 %, D = 3, 0 m = 1,1110 6h; r versus o * m T80 Figure F.1 SPRT spreadsheet graphing example . 92 Figure F.2 OC curve for probability of acceptance, P a95 Figure F.3 Expected tes

    46、t time for making a decision 95 Figure H.1 OC curve plotted from the spreadsheet calculations . 104 Figure K.1 Test plan types and terminology . 115 Figure K.2 Principle of test plans . 117 Figure K.3 Partitioning of the test plan graph . 117 Figure K.4 Interior nodes and border nodes . 118 Figure K

    47、.5 Paths to the accept line 118 Figure K.6 Paths to the reject line 118 Figure K.7 Probabilities of paths transfer between nodes . 119 6 61124 IEC:2012 Figure K.8 The recurrent element Two cases 121 Table 1 Advantages and disadvantages for the different test plan types . 14 Table 2 Overview of the s

    48、equential test plans given in Annex A and D . 18 Table 3 Fixed time/failure terminated test plans . 19 Table 4 Combined test plans in Annex D 24 Table A.1 Accept and reject lines for test plan A.1 . 26 Table A.2 Accept and reject lines for test plan A.2 . 28 Table A.3 Accept and reject lines for test plan A.3 . 30 Table A.4 Accept and reject lines for test plan A.4 . 32 Table A.5 Accept and reject lines for test plan A.5 . 34 Tabl


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