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    IEC 60512-17-1-2010 Connectors for electronic equipment - Tests and measurements - Part 17-1 Cable clamping tests - Test 17a Cable clamp robustness《电子设备连接器.测量和试验.第17-1部分 电缆夹试验.试验17a 电缆夹稳健性》.pdf

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    IEC 60512-17-1-2010 Connectors for electronic equipment - Tests and measurements - Part 17-1 Cable clamping tests - Test 17a Cable clamp robustness《电子设备连接器.测量和试验.第17-1部分 电缆夹试验.试验17a 电缆夹稳健性》.pdf

    1、 IEC 60512-17-1Edition 1.0 2010-06INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equipment Tests and measurements Part 17-1: Cable clamping tests Test 17a: Cable clamp robustness Connecteurs pour quipements lectroniques Essais et mesures Partie 17-1: Essais de maintien des cble

    2、s Essai 17a: Robustesse de la pince de maintien des cbles IEC60512-17-1:2010 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electro

    3、nic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please con

    4、tact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y com

    5、pris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comi

    6、t national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standar

    7、ds for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publicati

    8、ons: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new

    9、 IEC publications. Just Published details twice a month all new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and Fren

    10、ch, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre F

    11、AQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technol

    12、ogies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.h

    13、tm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform

    14、 sur les nouvelles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 00

    15、0 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur ce

    16、tte publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-17-1Edition 1.0 2010-06INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equipment Tests and measurements Part

    17、 17-1: Cable clamping tests Test 17a: Cable clamp robustness Connecteurs pour quipements lectroniques Essais et mesures Partie 17-1: Essais de maintien des cbles Essai 17a: Robustesse de la pince de maintien des cbles INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONA

    18、LE EICS 31.220.01 PRICE CODECODE PRIXISBN 978-2-88910-955-5 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-17-1 IEC:2010 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS

    19、AND MEASUREMENTS Part 17-1: Cable clamping tests Test 17a: Cable clamp robustness FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to pro

    20、mote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides

    21、 (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC als

    22、o participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possi

    23、ble, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. Whi

    24、le all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake

    25、to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestati

    26、on of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of th

    27、is publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or in

    28、direct, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for

    29、the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-17-1 has been

    30、 prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces Test 17a of IEC 60512-9, issued in 1992. The structure of IEC 60512 series is explained in IEC 60512-1-100. Th

    31、e text of this standard is based on the following documents: FDIS Report on voting 48B/2155/FDIS 48B/2189/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. 60512-17-1 IEC:2010 3 This publication has been drafted in

    32、 accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged unt

    33、il the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 4 60512-17-1 IEC:2010 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS

    34、AND MEASUREMENTS Part 17-1: Cable clamping tests Test 17a: Cable clamp robustness 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in

    35、 a detail specification. The object of this standard is to detail a standard test method to assess the ability of a cable-clamping device to withstand mechanical stresses likely to be encountered during normal usage. 2 Normative references The following referenced documents are indispensable for the

    36、 application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test

    37、1a: Visual examination 3 Preparation of the specimen The specimen shall consist of the specified cable/wire bundle fitted in the normal manner to its associated connector or sub-assembly by means of the cable-clamping device. The specimen shall be prepared and mounted in accordance with the detail s

    38、pecification. 4 Test method This test shall be done by means of a suitable device to measure and control the forces, e.g. a universal materials testing machine. With the specimen rigidly mounted in such an attitude that the cable/wire bundle is in a horizontal position, a bending moment shall be pro

    39、duced by applying a specified vertical force to the cable/wire bundle at a specified distance from the cable clamp. This force shall be increased gradually at a rate not to exceed 20 N/s until the specified value is reached. It shall be maintained at that value for 1 min. The force shall then be rem

    40、oved and the cable returned to the horizontal attitude. The specimen is then rotated at 90 increments around the horizontal axis. At each 90 increment, the specified bending moment is reapplied. This test shall be repeated the number of times stated in the detail specification. 60512-17-1 IEC:2010 5

    41、 5 Final measurements The specimen shall be examined visually in accordance with IEC 60512-1-1, test 1a at the junction of the cable/wire bundle and the clamping device and at the junction of the clamping device and the component or sub-assembly. 6 Requirements There shall be no damage to the cable/

    42、wire bundle, or to the specimen. The cable/wire bundle shall not be displaced permanently by more than the amount specified in the detail specification. 7 Details to be specified When this test is required by the detail specification, the following details shall be specified: a) preparation of the s

    43、pecimen and type of cable/wire bundle to be used and whether contacts have to be connected; b) mounting of the specimen; c) force to be applied and point of application; d) number of applications; e) requirements for final measurements; f) any deviation from the standard test method. _ 6 60512-17-1

    44、CEI:2010 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 17-1: Essais de maintien des cbles Essai 17a: Robustesse de la pince de maintien des cbles AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organisation m

    45、ondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI entre aut

    46、res activits publie des Normes internationales, des Spcifications techniques, des Rapports techniques, des Spcifications accessibles au public (PAS) et des Guides (ci-aprs dnomms “Publication(s) de la CEI“). Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intre

    47、ss par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec lOrganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord en

    48、tre les deux organisations. 2) Les dcisions ou accords officiels de la CEI concernant les questions techniques reprsentent, dans la mesure du possible, un accord international sur les sujets tudis, tant donn que les Comits nationaux de la CEI intresss sont reprsents dans chaque comit dtudes. 3) Les

    49、Publications de la CEI se prsentent sous la forme de recommandations internationales et sont agres comme telles par les Comits nationaux de la CEI. Tous les efforts raisonnables sont entrepris afin que la CEI sassure de lexactitude du contenu technique de ses publications; la CEI ne peut pas tre tenue responsa


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