1、 IEC 60444-7 Edition 1.0 2004-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement of quartz crystal unit parameters Part 7: Measurement of activity and frequency dips of quartz crystal units Mesure des paramtres des rsonateurs quartz Partie 7: Mesure des baisses de lactivit et de la frquence
2、des rsonateurs quartz IEC 60444-7:2004 colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2004 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, inclu
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16、 60444-7 Edition 1.0 2004-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement of quartz crystal unit parameters Part 7: Measurement of activity and frequency dips of quartz crystal units Mesure des paramtres des rsonateurs quartz Partie 7: Mesure des baisses de lactivit et de la frquence des
17、rsonateurs quartz INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE H ICS 31.140 PRICE CODE CODE PRIX ISBN 978-2-83220-705-5 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning!
18、 Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour inside 2 60444-7 IEC:2004 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS Pa
19、rt 7: Measurement of activity and frequency dips of quartz crystal units FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote inte
20、rnational co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereaft
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28、is IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of th
29、is IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60444-7 has been prepared by IEC technical committee 49: Piezoelectric and dielectric devices for frequency control and selection. This
30、bilingual version (2013-05) corresponds to the monolingual English version, published in 2004-04. The text of this standard is based on the following documents: FDIS Report on voting 49/637/FDIS 49/664/RVD Full information on the voting for the approval of this standard can be found in the report on
31、 voting indicated in the above table. The French version of this standard has not been voted upon. 60444-7 IEC:2004 3 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. This standard forms Part 7 of a series of publications dealing with measurements of quartz crysta
32、l unit parameters IEC 60444 consists of the following parts, under the general title Measurement of quartz crystal unit parameters: Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network Part 2: Phase o
33、ffset method for measurement of motional capacitance of quartz crystal units Part 4: Method for the measurement of the load resonance frequency f L , load resonance resistance R Land the calculation of other derived values of quartz crystal units, up to 30 MHz Part 5: Methods for the determination o
34、f equivalent electrical parameters using automatic network analyzer techniques and error correction Part 6: Measurement of drive level dependence (DLD) Part 7: Measurement of activity and frequency dips of quartz crystal units Part 8: Test fixture for surface mounted quartz crystal units The committ
35、ee has decided that the contents of this publication will remain unchanged until 2008. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours wh
36、ich are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 4 60444-7 IEC:2004 INTRODUCTION The tolerable activity dips of resonant resistance and frequency (Bandbreak) will be specified in the detail specification
37、. The measurement and evaluation of the activity/frequency dip for the quartz crystal unit requires special consideration as it uses the linear least squares method. 60444-7 IEC:2004 5 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS Part 7: Measurement of activity and frequency dips of quartz crystal
38、units 1 Scope This standard applies to activity and frequency dips for quartz crystal units over a temperature range. 2 Definitions 2.1 activity dip undesirable change in the crystal units load resonance frequency and/or resonance resistance caused by the coupling of different modes in a narrow temp
39、erature range and at a specified load capacitance and level of drive (see Figures 1 and 2) 2.2 frequency dip (bandbreak) undesirable perturbation or fluctuation in the crystal frequency occurring in a narrow temperature range as a deviation of the load resonance frequency from the smooth regular fre
40、quency temperature characteristic described by a polynomial of up to the 5 thorder. It usually shows an associated resistance change (see Figure 2) and the effect is usually drive level dependent 3 Measurements The following measurement parameters are necessary and should be given in the detail spec
41、ification: operating temperature range; load capacitance; level of drive. The evaluation of the data is made using a computer and is described in 3.3. Care shall be taken in selecting a suitable measurement time; this will depend on the type of crystal unit being measured. The drive current (in micr
42、oamperes) shall also be correct and controlled. The inspection method is selected from the following and specified in the individual specification: a) lot inspection and guaranteed by process control; b) sample inspection. 3.1 Reference method The measurement system consists of a -network in accorda
43、nce with IEC 60444 and a high precision temperature chamber, which allows to ramp-up the temperature at a constant small rate. 6 60444-7 IEC:2004 Each crystal is measured individually within the specified temperature range beginning at the lowest temperature as defined below. The temperature is then
44、 increased with a constant rate up to the maximum temperature as defined below. NOTE The temperature performance of the chamber should allow for the appropriate resolution and a monotonic small temperature ramp. The minimum/maximum measurement temperature shall be 5 K lower/10 K higher than the spec
45、ified minimum/maximum operating temperature. The number of data points should be such, that the temperature intervals between the measurement points are less or equal to 0,2 K. The rate of temperature change shall be 2 K/min 10 % within the whole temperature range. The actual temperature at a locati
46、on in the vicinity of the crystal under test must be recorded at each measurement point together with the actual (load) resonance frequency and resistance. The frequency and resistance are measured at the specified drive level and at the specified resonance condition, i.e. load resonance, resonance
47、(zero phase), or series resonance. The measurement points shall lie within one tenth of the resonance bandwidth. NOTE Because of the irregular and discontinuous behaviour of the crystal impedance at the occurrence of an activity dip, more distant measurement points can lead to erroneous results. Onl
48、y the data within the operating temperature range are used for the evaluation. The method is given in 3.3 and is the same as described for the batch method. 3.2 Batch method The measurement system consists of a -network in accordance with IEC 60444 and a variable temperature chamber. In the batch me
49、thod, a number of crystals are measured in sequence in the temperature chamber. Each crystal is measured in turn at each temperature beginning at the lowest specified temperature. The temperature is then increased in steps up to the maximum specified temperature. The recommended temperature step is 2 K. NOTE 1 Narrow dips may require a high precision temperature chamber and smaller temperature steps. NOTE 2 The temperature p
