1、NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 6041 8-1 1974 AMENDEMENT 2 AMENDMENT 2 1981-11 Amendement 2 Con de nsate u rs varia b I es Premire partie: Dfinitions et mthodes dessai Amendment 2 Var ia b I e ca paci tors Part 1: Terms and methods of test O IEC 1981 Droits de reproduction rservs
2、 -Copyright - ail rights reserved International Electrotechnical Commission Telefax: +41 22 919 0300 3, rue de Varemb Geneva, Switzerland IEC web site http: /www.iec.ch e-mail: inmailiec.ch C Commission Electrotechnique Internationale CODE PRIX International Electrotechnical Commission PRICE CODE Me
3、MfiyHapOnHaR 3nepoexwrecna HOMHCCHR O Pour prix, voir catalogue en vigueur For price, see current catalogue -2- Page 16 7.1 Mesure de la capacit Remplacer le troisime alina par le suivant: Les condensateurs daccord sont souvent munis par construction de condensateurs semi-fixes relis lectriquement c
4、eux-ci. Ils doivent donc tre essays suivant la spcification particulire relative ce modle de condensateur daccord dans les conditions dfieies, pour chaque essai, par ladite spcification. Lorsquils ne sont pas relis ainsi, les condensateurs semi-fixes doivent tre essays sparment suivant leur spcifica
5、tion particulire. Page 20 7.3 Capacit de couplage Remplacer le texte de ce paragraphe par le suivant: Lorsque le couplage entre lments dun condensateur plusieurs lments peut avoir une consquence technique importante, les limites de ce couplage seront indiques dans la spcifi- cation applicable. Lorsq
6、uil est ncessaire de mesurer la capacit de couplage entre les lments dun condensateur plusieurs lments la mthode trois bornes dcrite ci-dessous doit tre utilise. Le condensateur doit tre mont comme prescrit dans la spcification applicable en utilisant une des mthodes spcifies au paragraphe 4.2 et do
7、it tre positionn sa capacit minimale. Pendant lexcution de la mesure de la capacit de couplage entre deux lments les autres lments doivent tre connects la masse de lquipement de mesure. Le circuit de base de la mesure est le suivant: IC2 -I- M T CI, C2 = lments du condensateur mesurer Ck = capacit d
8、e couplage Publication 418-1 mod 2 (Novembre 1981) -3- Page 17 7.1 Capacitance measurement Replace the third paragraph by the following: Tuning capacitors by construction often incorporate preset capacitors electrically connected to them. They shall therefore be tested in accordance with the detail
9、specification relevant to this style of tuning capacitor under the conditions for each test, as prescribed in that specifi- cation. When they are not so connected, the preset capacitors shall be tested separately in accordance with the appropriate detail specification. Publicarion 418-1 Amend 2 (Nov
10、ember 1981) 7.3 Coupling capacitance Replace the text of this sub-clause by the following: When coupling between sections of a multi-section capacitor is important, the limits of coupling shall be stated in the relevant specification. When the coupling capacitance between the sections of a multi-sec
11、tion capacitor has to be measured, the three terminal method described below shall be used. The capacitor shall be mounted as prescribed in the relevant specification, using one of the methods specified in Sub-clause 4.2 and shall be set at minimum capacitance position. During the measurement of the
12、 coupling capacitance between two sections, any other section shall be connected to the ground of the test equipment. The basic circuit of the measurement is as follows: CI, C2 = sections of the capacitor to be measured Ck = coupling capacitance Publication 418-1 Amend 2 (November 1981) -4- Paragrap
13、he 1.3 (suite) -_-_-_-_- Les sorties correspondant la capacit de couplage C, mesurer sont relies aux bornes H et La capacit doit tre mesure une frquence de 800 Hz 1 200 Hz ou une autre frquence pourvu que lquipement de mesure soit corrl des talons primaires de capacit talonns 1 kHz. La frquence de m
14、esure doit tre donne dans la spcification particulire si elle est diff- La spcification particulire doit prescrire : L. Les autres sorties des lments C, et C2 sont relies la borne M. rente de 800 Hz 1200 Hz. a) les lments entre lesquels la capacit de couplage doit tre mesure; b) les limites de cette
15、 capacit de couplage. cable. La capacit de couplage ne doit pas dpasser les limites prescrites dans la spcification appli- Publication 418-1 mod 2 (Novembre 1981) -5- Sub-clause 1.3 (continued) The coupling capacitance C, to be measured is connected between the terminations H and L. The remaining te
16、rminations of the sections C, and C2 shall be connected to M. The capacitance shall be measured at a frequency of 800 Hz to 1 200 Hz or at another fre- quency provided that the test equipment used is correlated to primary standards of capacitance calibrated at 1 kHz. The measuring frequency if other
17、 than 800 Hz to 1 200 Hz shall be given in the detail specifi- The relevant specification shall prescribe: cation. a) the sections between which the coupling capacitance shall be measured; b) the limits of this coupling capacitance. The coupling capacitance shall not exceed the limits prescribed in
18、the relevant specification. Publication 418-1 Amend 2 (November 1981) ICs 31.060.60 Typeset and printed by the IEC Central Office GENEVA, SWITZERLAND NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 6041 8-1 1974 AMENDEMENT 1 AMENDMENT 1 1976-04 Amendement 1 Con dens ate u rs variables Premire pa
19、rtie: Dfinitions et mthodes dessai Amendment I Variable capacitors Part 1: Terms and methods of test O IEC 1976 Droits de reproduction rservs -Copyright - all rights resewed International Electrotechnical Commission Telefax: +41 22 91 9 0300 3, rue de Varemb Geneva, Switzerland IEC web site http: /w
20、ww.iec.ch e-mail: inmailiec.ch B Commission Electrotechnique Internationale CODE PRIX International Electrotechnical Commission PRICE CODE MemnvHaponHan 3nenTpoTexHwecnaR KOMHCCHR Pour prix, voir catalogue en vigueur For price, see current catalogue O -2- I 1% I ci= I IB I MI I G Page 20 )u I I I I*
21、 !J C n( L, C2 C? g L2 i ?k D I, 069176 VI, V, = voltmtres h.f (prcision de 0,5% dviation C, C2 = lments du condensateur mesurer G = gnrateur h.f. CV = condensateur d?accord Ll = inductance L2 = inductance d?adaptation maximale) C, = capacit de couplage el e2 (couplage: - = N, OU N est, de prfrence,
22、 40) Ce qui suit peut servir d?indication quant aux valeurs utiliser: a) Cv - 10 Cl - 10 Cz et Cv b) gnrateur haute frquence capable de produire une frquence dans la bande 200 kHz 300 kHz; c) la valeur de l?inductance L1 doit convenir l?accord avec Cv + Cp 250 kHz, soit: L1 (C? + Cz)r Rsistance dyna
23、mique du circuit accord = - 10 XCk dans laquelle r est la rsistance de perte de l?inductance et X sa ractance. Mthode de inesure Le circuit tant connect comme il est indiqu et dcrit plus haut, rgler Cv jusqu? ce que le circuit L, plus Cr Mesurer U, et U,. Mesurer ensuite Cz et Cv ainsi que le Q de l
24、?inductance L, 250 kHz. Substituer ces valeurs dans l?quation suivante, puis calculer ck: et C2 puisse rsonner environ 250 kHz. (CZ + CV) N U2 c, = Q * Ulz - (N. ?1? N tant le rapport de tension du transformateur, de prfrence 40, Q tant le facteur d?amplification de L1 250 kHz et, condition que le f
25、acteur Q de (Cv + Cz) soit considrablement plus lev que le facteur Q de L1 la mme frquence. La capacit de couplage doit rester dans les limites prescrites dans la spcification correspondante. La spcification correspondante doit stipuler: a) les lments entre lesquels la capacit de couplage doit tre m
26、esure; b) les limites de cette capacit de couplage. -3- Page 21 7.3 Coupling capacitance Replace the existing text by the following: Where coupling betiveen sections of a multi-section capacitor is important, the limits of coupling shall be stated in the relevant specification. Where a limit of the
27、coupling capacitance between the sections of a multi-section capacitor is required by the user, a suitable test method is as follows. The capacitor shall be mounted as prescribed in the relevant specification, using one of the methods specified in Sub-clause 4.2 and shall be set at minimum capacitan
28、ce position. When measuring the coupling capacitance between two sections, any other section shall be connected to the low potential side of the test equipment. The circuit for the measurement shall be as follows, the capacitor under measurement being connected to terminals A, B, C and D and the cou
29、pling capacitance Ck being measured between sections Cl and Cz. V, V, = h.f. voltmeters (accuracy 0.5% for full-scale G = h.f. generator Cv = tuning capacitor LI = coil L2 = coupling coil el e2 Cl, C, = sections of the capacitor to be measured deflection) Ck = coupling capacitance (coupling - = N, w
30、here N is preferably 40) The following gives a guide to the values to be used: a) Cv w 10 Cl w 10 Cz and Cv 9 k; 6) high-frequency generator capable of generating a frequency in the band 200 kHz to 300 kHz; c) the value of coil L1 to be suitable for tuning with Cv + Cz at 250 kHz, i.e.: L1 (CV + CzP
31、 dynamic resistance of tuned circuit = * 10 XCk where r is the loss resistance of the coil and X is the reactance of the coil Method of measurenieiit With the circuit connected as shown and as described above, adjust Cv until circuit LI plus Cv and Cz resonates Measure U, and U2. Then measure C, and
32、 Cv and also the Q of coil Li at 250 kHz. Substitute these values in the following equation and calculate ck: at approximately 250 kHz. N being the voltage ratio of transformer, preferably 40, and Q being the magnification factor of L1 at 250 kHz and provided that the Q factor of (Cv + C,) exceeds c
33、onsiderably the Q factor of LI at the same frequency. The coupling capacitance shall fulfil the limits prescribed in the relevant specification. The relevant specification shall prescribe : a) the sections between which the coupling capacitance shall be measured ; b) the limits of this coupling capa
34、citance. ICs 31.060.60 Typeset and printed by the IEC Central Office GENEVA, SWITZERLAND NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 6041 8-1 Premire dition First edition l974-01 Condensateurs variables Premire partie: Dfinitions et mthodes dessai Va ri ab le capacitors Part 1: Terms and met
35、hods of test Numro de rfrence Reference number CEIIIEC 60418-1: 1974 Numros des publications Depuis le 1 er janvier 1997, les publications de la CE1 sont numrotes partir de 60000. Publications consolides Les versions consolides de certaines publications de la CE1 incorporant les amendements sont dis
36、ponibles. Par exemple, les numros ddition 1.0, 1.1 et 1.2 indiquent respectivement la publication de base, la publication de base incorporant lamendement 1, et la publication de base incorporant les amendements 1 et 2. Validit de la prsente publication Le contenu technique des publications de la CE1
37、 est constamment revu par ia CE1 afin quil reflte ltat actuel de la technique. Des renseignements relatifs la date de reconfir- mation de la publication sont disponibles dans le Catalogue de la CEI. Les renseignements relatifs des questions ltude et des travaux en cours entrepris par le comit techni
38、que qui a tabli cette publication, ainsi que la liste des publications tablies, se trouvent dans les documents ci- dessous: Site web) de la CEI“ Catalogue des publications de ia CE1 Publi annuellement et mis jour rgulirement (Catalogue en ligne) Bulletin de la CE1 Disponible ia fois au .site web de
39、la CEI* et comme priodique imprime Terminologie, symboles graphiques et littraux En ce qui concerne la terminologie gnrale, le lecteur se reportera la CE1 60050: Vocabulaire Electro- technique International (VE I). Pour les symboles graphiques, les symboles littraux et les signes dusage gnral approu
40、vs par la CEI, le lecteur consultera la CE1 60027: Symboles littraux 2 utiliser en lectrotechnique, la CE1 6041 7: Symboles graphiques utilisables sur le matriel. Index, relev et compilation des feuilles individuelles, et la CE1 60617: Symboles graphiques pour schmas. * Voir adresse 4te web sur la p
41、age de titre. Numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series. Consolidated publications Consolidated versions of some IEC publications including amendments are available. For example, edition numbers 1.0, 1.1 and 1.2 refer, respectively, to th
42、e base publication, the base publication incor- porating amendment 1 and the base publication incorporating amendments 1 and 2. Validity of this publication The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology.
43、 Information relating to the date of the reconfirmation of the publication is available in the IEC catalogue. Information on the subjects under consideration and work in progress undertaken by the technical committee which has prepared this publication, as well as the list of publications issued, is
44、 to be found at the following IEC sources: IEC web site* Catalogue of IEC publications Published yearly with regular updates (On-line catalogue)* Available both at the IEC web site“ and as a printed periodical IEC Bulletin Terminology, graphical and letter symbols For general terminology, readers ar
45、e referred to I EC 60050: International Electrotechnical Vocabulary (IEV). For graphical symbols, and letter symbols and signs approved by the IEC for general use, readers are referred to publications IEC 60027: Letter symbols /o be used in electrical technology, IEC 60417: Graphical symbols for use
46、 on equipment. Index, survey and compilation of the single sheets and IEC 60617: Graphical symbols for diagrams. * See web site address on title page. NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 6041 84 Premire dition First edition 1 974-0 1 Condensateurs variables Premire partie: Dfinitions
47、 et mthodes dessai Variable capacitors Part I: Terms and methods of test O IEC 1974 Droits de reproduction rservs -Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni No part of this publication may be reproduced or utilized in utilise sous quelque forme que
48、ce soit et par aucun any form or by any means, electronic or mechanical, procede, lectronique ou mcanique, y compris la photo- including photocopying and microfilm, without permission in copie et les microfilms, sans raccord crit de lditeur. writing from the publisher. International Electrotechnical Commission Telefax: +41 22 919 0300 3, rue de Varemb Geneva, Switzerland IEC web site http: llw.iec.ch e-mail: inmailiec.ch U CODE PRIX PRICE CODE Pour prix, voir catalogue en vigueur For price, see current catalogue Commission Electrotechn
