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    SANS 61000-4-30-2009 Electromagnetic compatibility (EMC) Part 4-30 Testing and measurement techniques - Power quality measurement methods《电磁兼容性(EMC) 第4-30部分 试验及测量技术-功率质量测量方法》.pdf

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    SANS 61000-4-30-2009 Electromagnetic compatibility (EMC) Part 4-30 Testing and measurement techniques - Power quality measurement methods《电磁兼容性(EMC) 第4-30部分 试验及测量技术-功率质量测量方法》.pdf

    1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA

    2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any

    3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-22539-1 SANS 61000-4-30:2009Edition 2 IEC 61000-4-30:2008Edition 2SOUTH AFRICAN NATIONAL STANDARD Electromagnetic compatibility (EMC) Part

    4、 4-30: Testing and measurement techniques Power quality measurement methods This national standard is the identical implementation of IEC 61000-4-30:2008, and is adopted with the permission of the International Electrotechnical Commission. Published by SABS Standards Division 1 Dr Lategan Road Groen

    5、kloof Private Bag X191 Pretoria 0001Tel: +27 12 428 7911 Fax: +27 12 344 1568 www.sabs.co.za SABS SANS 61000-4-30:2009 Edition 2 IEC 61000-4-30:2008 Edition 2 Table of changes Change No. Date Scope National foreword This South African standard was approved by National Committee SABS TC 73, Electroma

    6、gnetic compatibility, in accordance with procedures of the SABS Standards Division, in compliance with annex 3 of the WTO/TBT agreement. This SANS document was published in March 2009. This SANS document supersedes SANS 61000-4-30:2003 (edition 1 as modified by IEC corrigendum 1:2006). IEC 61000-4-3

    7、0Edition 2.0 2008-10INTERNATIONAL STANDARD NORME INTERNATIONALEElectromagnetic compatibility (EMC) Part 4-30: Testing and measurement techniques Power quality measurement methods Compatibilit lectromagntique (CEM) Partie 4-30: Techniques dessai et de mesure Mthodes de mesure de la qualit de laliment

    8、ation IEC61000-4-30:2008 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEMSANS 61000-4-30:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 2 61000-4-30 IEC:2008 CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope.7 2 Normative references7 3 Te

    9、rms and definitions .8 4 General 12 4.1 Classes of measurement methods .12 4.2 Organization of the measurements.13 4.3 Electrical values to be measured13 4.4 Measurement aggregation over time intervals 14 4.5 Measurement aggregation algorithm 14 4.5.1 Requirements 14 4.5.2 150/180 cycle aggregation

    10、.14 4.5.3 10 min aggregation 15 4.5.4 2 hour aggregation.18 4.6 Real time clock (RTC) uncertainty18 4.7 Flagging concept .18 5 Power quality parameters19 5.1 Power frequency19 5.1.1 Measurement method 19 5.1.2 Measurement uncertainty and measuring range19 5.1.3 Measurement evaluation 19 5.1.4 Aggreg

    11、ation .19 5.2 Magnitude of the supply voltage.20 5.2.1 Measurement method 20 5.2.2 Measurement uncertainty and measuring range20 5.2.3 Measurement evaluation 20 5.2.4 Aggregation .20 5.3 Flicker .20 5.3.1 Measurement method 20 5.3.2 Measurement uncertainty and measuring range20 5.3.3 Measurement eva

    12、luation 21 5.3.4 Aggregation .21 5.4 Supply voltage dips and swells.21 5.4.1 Measurement method 21 5.4.2 Detection and evaluation of a voltage dip .22 5.4.3 Detection and evaluation of a voltage swell 22 5.4.4 Calculation of a sliding reference voltage .23 5.4.5 Measurement uncertainty and measuring

    13、 range23 5.4.6 Aggregation .24 5.5 Voltage interruptions24 5.5.1 Measurement method 24 5.5.2 Evaluation of a voltage interruption 24 5.5.3 Measurement uncertainty and measuring range25 5.5.4 Aggregation .25 5.6 Transient voltages .25 SANS 61000-4-30:2009This s tandard may only be used and printed by

    14、 approved subscription and freemailing clients of the SABS .61000-4-30 IEC:2008 3 5.7 Supply voltage unbalance 25 5.7.1 Measurement method 25 5.7.2 Measurement uncertainty and measuring range26 5.7.3 Measurement evaluation 26 5.7.4 Aggregation .26 5.8 Voltage harmonics.26 5.8.1 Measurement method 26

    15、 5.8.2 Measurement uncertainty and measuring range27 5.8.3 Measurement evaluation 27 5.8.4 Aggregation .27 5.9 Voltage interharmonics 27 5.9.1 Measurement method 27 5.9.2 Measurement uncertainty and measuring range28 5.9.3 Measurement evaluation 28 5.9.4 Aggregation .28 5.10 Mains signalling voltage

    16、 on the supply voltage .28 5.10.1 Measurement method 28 5.10.2 Measurement uncertainty and measuring range29 5.10.3 Measurement evaluation 29 5.10.4 Aggregation .29 5.11 Rapid Voltage Changes (RVC).29 5.12 Measurement of underdeviation and overdeviation parameters.29 5.12.1 Measurement method 29 5.1

    17、2.2 Measurement uncertainty and measuring range30 5.12.3 Aggregation .30 6 Range of influence quantities and steady-state verification 30 6.1 Range of influence quantities.30 6.2 Steady-state performance verification 32 Annex A (informative) Power quality measurements Issues and guidelines.34 Annex

    18、B (informative) Power quality measurement Guidance for applications 47 Annex C (informative) Guidance on instruments .59 Bibliography62 Figure 1 Measurement chain 13 Figure 2 Synchronization of aggregation intervals for Class A .15 Figure 3 Synchronization of aggregation intervals for class S: param

    19、eters for which gaps are not permitted 16 Figure 4 Synchronization of aggregation intervals for class S: parameters for which gaps are permitted (see 4.5.2).17 Figure 5 Example of supply voltage unbalance uncertainty26 Figure A.1 Frequency spectrum of typical representative transient test waveforms

    20、40 Table 1 Influence quantity range.31 Table 2 Uncertainty steady-state verification for class A and class S.33 Table C.1 Summary of requirements.60 SANS 61000-4-30:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 4 61000-4-30 IEC:2008 IN

    21、TERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-30: Testing and measurement techniques Power quality measurement methods FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electr

    22、otechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifica

    23、tions, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. Internationa

    24、l, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal dec

    25、isions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for inte

    26、rnational use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In o

    27、rder to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be c

    28、learly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability s

    29、hall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including l

    30、egal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this p

    31、ublication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61000-4-30 has been prepared by subcommittee 77A: Lo

    32、w- frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility. This standard forms part 4-30 of IEC 61000. It has the status of a basic EMC publication in accordance with IEC Guide 107. This second edition cancels and replaces the first edition published in 2003. This edition

    33、includes the following significant technical changes with respect to the previous edition. Adjustments, clarifications, and corrections to class A and class B measurement methods. A new category, class S, intended for survey instruments, has been added. A new Annex C gives guidance on instruments. S

    34、ANS 61000-4-30:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61000-4-30 IEC:2008 5 The text of this standard is based on the following documents: FDIS Report on voting 77A/660/FDIS 77A/666/RVD Full information on the voting for the appr

    35、oval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 61000 series, under the general title Electromagnetic compatibility (EMC), can be found on the

    36、IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdra

    37、wn, replaced by a revised edition, or amended. SANS 61000-4-30:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 6 61000-4-30 IEC:2008 INTRODUCTION IEC 61000 is published in separate parts according to the following structure: Part 1: Gene

    38、ral General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility

    39、of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into s

    40、everal parts, published either as International Standards or as Technical Specifications or Technical Reports, some of which have already been published as sections. Others will be published with the part number followed by a dash and completed by a second number identifying the subdivision (example

    41、: IEC 61000-6-1). SANS 61000-4-30:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61000-4-30 IEC:2008 7 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-30: Testing and measurement techniques Power quality measurement methods 1 Scope This part

    42、of IEC 61000-4 defines the methods for measurement and interpretation of results for power quality parameters in 50/60 Hz a.c. power supply systems. Measurement methods are described for each relevant parameter in terms that give reliable and repeatable results, regardless of the methods implementat

    43、ion. This standard addresses measurement methods for in situ measurements. Measurement of parameters covered by this standard is limited to voltage phenomena that can be conducted in a power system. The power quality parameters considered in this standard are power frequency, magnitude of the supply

    44、 voltage, flicker, supply voltage dips and swells, voltage interruptions, transient voltages, supply voltage unbalance, voltage harmonics and interharmonics, mains signalling on the supply voltage and rapid voltage changes. Depending on the purpose of the measurement, all or a subset of the phenomen

    45、a on this list may be measured. NOTE 1 Information about current parameters may be found in A.3 and A.5. This standard gives measurement methods and appropriate performance requirements, but does not set thresholds. The effects of transducers inserted between the power system and the instrument are

    46、acknowledged but not addressed in detail in this standard. Precautions on installing monitors on live circuits are addressed. NOTE 2 Some guidance about effects of transducers may be found in IEC 61557-12. 2 Normative references The following referenced documents are indispensable for the applicatio

    47、n of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-161, International Electrotechnical Vocabulary (IEV) Chapter 161: Electro-magnetic compatibility IEC 61000-2-2

    48、:2002, Electromagnetic compatibility (EMC) Part 2-2: Environment Compatibility levels for low-frequency conducted disturbances and signalling in public low-voltage power supply systems IEC 61000-2-4, Electromagnetic compatibility (EMC) Part 2-4: Environment Compatibility levels in industrial plants

    49、for low-frequency conducted disturbances IEC 61000-3-8, Electromagnetic compatibility (EMC) Part 3: Limits Section 8: Signalling on low-voltage electrical installations Emission levels, frequency bands and electromagnetic disturbance levels SANS 61000-4-30:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 8 61000-4-30 IEC:2008 IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) Part 4-4: Testing an


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