欢迎来到麦多课文档分享! | 帮助中心 海量文档,免费浏览,给你所需,享你所想!
麦多课文档分享
全部分类
  • 标准规范>
  • 教学课件>
  • 考试资料>
  • 办公文档>
  • 学术论文>
  • 行业资料>
  • 易语言源码>
  • ImageVerifierCode 换一换
    首页 麦多课文档分享 > 资源分类 > PDF文档下载
    分享到微信 分享到微博 分享到QQ空间

    SAE PT-174-2015 Design and the Reliability Factor (To Purchase Call 1-800-854-7179 USA Canada or 303-397-7956 Worldwide).pdf

    • 资源ID:1028227       资源大小:4.94MB        全文页数:96页
    • 资源格式: PDF        下载积分:10000积分
    快捷下载 游客一键下载
    账号登录下载
    微信登录下载
    二维码
    微信扫一扫登录
    下载资源需要10000积分(如需开发票,请勿充值!)
    邮箱/手机:
    温馨提示:
    如需开发票,请勿充值!快捷下载时,用户名和密码都是您填写的邮箱或者手机号,方便查询和重复下载(系统自动生成)。
    如需开发票,请勿充值!如填写123,账号就是123,密码也是123。
    支付方式: 支付宝扫码支付    微信扫码支付   
    验证码:   换一换

    加入VIP,交流精品资源
     
    账号:
    密码:
    验证码:   换一换
      忘记密码?
        
    友情提示
    2、PDF文件下载后,可能会被浏览器默认打开,此种情况可以点击浏览器菜单,保存网页到桌面,就可以正常下载了。
    3、本站不支持迅雷下载,请使用电脑自带的IE浏览器,或者360浏览器、谷歌浏览器下载即可。
    4、本站资源下载后的文档和图纸-无水印,预览文档经过压缩,下载后原文更清晰。
    5、试题试卷类文档,如果标题没有明确说明有答案则都视为没有答案,请知晓。

    SAE PT-174-2015 Design and the Reliability Factor (To Purchase Call 1-800-854-7179 USA Canada or 303-397-7956 Worldwide).pdf

    1、Design and the Reliability Factor P151383_PT-174.indb 1 11/13/15 2:35 PMOther SAE books of interest: Counterfeit Electronic Parts and Their Impact on Supply Chains By Kirsten M. Koepsel (Product Code: T-130) Automotive E/E Reliability By John Day (Product Code: T-126) Automotive Electronics Reliabil

    2、ity By Ronald K. Jurgen (Product Code: PT-144) For more information or to order a book, contact: SAE INTERNATIONAL 400 Commonwealth Drive Warrendale, PA 15096 Phone: +1.877.606.7323 (U.S. and Canada only) or +1.724.776.4970 (outside U.S. and Canada) Fax: +1.724.776.0790 Email: CustomerServicesae.org

    3、 Website: books.sae.org P151383_PT-174.indb 2 11/13/15 2:35 PMDesign and the Reliability Factor By John Day Warrendale, Pennsylvania, USA P151383_PT-174.indb 3 11/13/15 2:35 PM Copyright 2016 SAE International eISBN: 978-0-7680-8268-5Copyright 2016 SAE International. All rights reserved. No part of

    4、this publication may be reproduced, stored in a retrieval system, distributed, or transmitted, in any form or by any means without the prior written permission of SAE International. For permission and licensing requests, contact SAE Permissions, 400 Commonwealth Drive, Warrendale, PA 15096-0001 USA;

    5、 e-mail: copyrightsae.org; phone: 724-772-4028; fax: 724-772- 9765. Printed in the United States of America Library of Congress Catalog Number 2015953119 SAE Order Number PT-174 http:/dx.doi.org/10.4271/pt-174 Information contained in this work has been obtained by SAE International from sources bel

    6、ieved to be reliable. However, neither SAE International nor its authors guarantee the accuracy or completeness of any information published herein and neither SAE International nor its authors shall be responsible for any errors, omissions, or damages arising out of use of this information. This wo

    7、rk is published with the understanding that SAE International and its authors are supplying information, but are not attempting to render engineering or other professional services. If such services are required, the assistance of an appropriate professional should be sought. ISBN-Print 978-0-7680-8

    8、157-2 ISBN-PDF 978-0-7680-8268-5 ISBN-epub 978-0-7680-8270-8 ISBN-prc 978-0-7680-8269-2 To purchase bulk quantities, please contact SAE Customer Service e-mail: CustomerServicesae.org phone: +1.877.606.7323 (inside USA and Canada) +1.724.776.4970 (outside USA) fax: +1.724.776.0790 Visit the SAE Book

    9、store at books.sae.org 400 Commonwealth Drive Warrendale, PA 15096 E-mail: CustomerServicesae.org Phone: +1.877.606.7323 (inside USA and Canada)+1.724.776.4970 (outside USA) Fax: +1.724.776.0790 P151383_PT-174.indb 4 11/13/15 2:35 PMv Table of Contents Introduction . 1 Efficient Reliability and Safe

    10、ty Analysis for Mixed-Criticality Embedded Systems (2011-01-0445) 3 Maurice Sebastian, Philip Axer, and Rolf Ernst, Technische Universitt Braunschweig; Nico Feiertag and Marek Jersak, Symtavision GmbH CAN Security: Cost-Effective Intrusion Detection for Real-Time Control Systems (2014-01-0340) 21 Sa

    11、toshi Otsuka and Tasuku Ishigooka, Hitachi, Ltd.; Yukihiko Oishi and Kazuyoshi Sasazawa, Hitachi Automotive Systems, Ltd. An AUTOSAR-Compliant Automotive Platform for Meeting Reliability and Timing Constraints (2011-01-0448) . 33 Junsung Kim, Gaurav Bhatia, and Ragunathan Rajkumar, Carnegie Mellon U

    12、niv.; Markus Jochim, General Motors Research Design for Reliability: Overview of the Systemic Approach for Failure Analysis in Electronics (2011-36-0056) . 49 Mauro C. Andreassa and Joo Ricardo Tiusso, Ford Motor Company Brazil About Trends in the Strategy of Development Accelerated Reliability and

    13、Durability Testing Technology (2012-01-0206) . 57 Lev Klyatis, Sohar Inc. Reliability of Multi-Sensor Fusion for Next Generation Cars and Trucks (2014-01-0718) 65 Venkatesh Agaram, PTC Inc. Techniques and Measures for Improving Domain Controller Availability while Maintaining Functional Safety in Mi

    14、xed Criticality Automotive Safety Systems (2013-01-0198) 73 Swapnil Gandhi, Delphi Deutschland GmbH; Simon P. Brewerton, Infineon Technologies UK Ltd. About the Editor 87 P151383_PT-174.indb 5 11/13/15 2:35 PMP151383_PT-174.indb 6 11/13/15 2:35 PM1 Introduction Sophisticated infotainment systems are

    15、 increasingly common in cars today. So are systems such as lane departure warning, adaptive cruise control, and blind-spot monitoring, which all have the purpose of making cars more reliable and safe. The proliferation of infotainment, safety, connectivity, powertrain control, body electronics, and

    16、other “smart” features has increased the market for automotive semiconductor devices. According to the Gartner research firm, automotive semiconductor revenue grew 10.3% in 2014 to $30 billion, driven by strength in LEDs (light emitting diodes), image sensors, ASSPs (application-specific standard pr

    17、oducts), and analog ICs. (https:/ market-share-analysis-automotive-semiconductors) Mark Fitzgerald, Associate Director of Strategy Analytics Automotive Practice, notes that vehicle makers increasing use of sophisticated electronic systems to develop vehicles that are safer, more fuel efficient, and

    18、environmentally friendly is creating a demand for a higher number of sensors per vehicle. (https:/ analytics/news/strategy-analytics-press-releases/strategy- analytics-press-release/2014/12/09/global-automotive- sensor-demand-to-exceed-$25-8-billion-by-2021#. VfhDv_SULFU ) Hiroaki Kaneho, General Ma

    19、nager of Renesas Electronics Corporations automotive systems division marketing unit, explains that automotive MCUs (microcontroller units) implement safety features; enhance environmental friendliness; and provide convenience, comfort, connectivity, and entertainment for drivers and passengers. For

    20、 that reason, it is not unusual for a typical mid-priced new car to contain hundreds of MCUs spanning a range of processing and communication capabilities. “Going forward, even larger numbers of embeddable MCUs will be needed to meet the growing number of standard and optional electronically control

    21、led capabilities required by regulators and desired by car buyers,” says Kaneho. “These design requirements will necessitate chips with greater functionality.” (http:/ index.jsp) More chips and greater functionality translate to further networking/communications activity within the car, and that rai

    22、ses the prospect of potentially serious errors. Minimizing those errors by design is the focus of this book, which contains seven SAE Internationals handpicked technical papers, each important for engineers with responsibility for ultimate vehicle safety. They cover: A way to calculate the reliabili

    23、ty of priority-driven, real-time components with respect to timing failures. Assessing components load situations during a certain interval of time, and covering each potential timing effect results in a realistic estimate of each components reliability. A delayed-decision cycle detection method tha

    24、t can detect and prevent spoofing attacks with high accuracy. The method detects intrusion by evaluating a reception cycle of data frames, and it can destroy an intrusive data frame when it is determined to be attacking data. An AUTOSAR-compliant automotive platform for meeting reliability and timin

    25、g constraints. The platform is based on a new software-component (SWC) allocation algorithm for fail-stop processors to support fault- tolerance with bounded recovery times. An eight-point process for determining the cause of failures with real-world cases in which the process was used. The authors

    26、also list the main reasons why engineering items fail. How accelerated reliability and durability testing technology (ART/ADT)based on an accurate simulation of real-world conditionscan better predict reliability and durability. How to achieve reliable sensor-fusion despite sensor system complexity

    27、and inconsistent reliability. How to improve domain controller availability while maintaining functional safety in mixed criticality automotive safety systems. Each paper provides insightful detail on a topic of increasing importancethe challenge to design for vehicle safety and reliability as these

    28、 factors are influenced by automotive electronics technology. P151383_PT-174.indb 1 11/13/15 2:35 PMP151383_PT-174.indb 2 11/13/15 2:35 PM3 ABSTRACT Due to the increasing integration of safety-critical functionalities into electronic devices, safety-related system design and certification have becom

    29、e a major challenge. Amongst others a suitable reaction of components in case of internal errors must be ensured in order to prevent a function from failing and to guarantee a certain degree of reliability. In this context a wide variety of different fault tolerance mechanisms have been developed in

    30、 the past, including analytical considerations of error coverage and resulting reliability. However, most of these mechanisms induce a certain timing overhead, which in turn might affect the real- time capabilities of the system in a negative way. More concretely, even if each error is treated adequ

    31、ately such that no logical failure occurs, a timing failure due to missing a deadline cannot be ruled out definitely. Thus, there is a growing need for appropriate methods to calculate the probability of timing failures and to prove that potential reliability and safety constraints are not violated.

    32、 In this paper we present an analysis approach for networked systems as well as highly integrated multi-core architectures to calculate reliability with respect to timing failures. For that purpose simulation techniques are less appropriate and expensive due to the rare fault events, leading to exha

    33、ustive simulation times until results are statistically relevant. Therefore, formal methods have been developed to prove that the considered embedded real-time system is working correctly and that failure rates are bounded according to the required safety level. Further on we present an extension of

    34、 the basic analysis ideas to include the influence of different error models into reliability analysis. Special emphasis is put on mixed-criticality systems, i.e. systems with applications of different safety requirements. We propose an approach to decouple the reliability analyses for these applica

    35、tions and to determine an individual safety integrity level for each application. Based on this approach it is possible to refine the conservative concept of IEC 61508 to take the most critical application as a basis for the whole system, enabling cost reduction and automated qualification. Based on

    36、 a prototype implementation for Symtavisions SymTA/S tool suite we will show how the presented methodologies can be integrated into a safety related design flow. Based on that kind of tooling support the presented approaches can be applied for different stages of the design process, such as design s

    37、pace exploration and optimization as well as for verification and certification purposes. 1. INTRODUCTION The increasing demand for comfort and driver assistance functionalities in upcoming vehicle generations poses new challenges on the E/E/PE (electrical/electronic/programmable electronic) equipme

    38、nt of a car. A large variety of ubiquitous services should be realized by embedded systems in a cost- and power-efficient way, providing a maximum degree of usability and dependability. The consequence is a continuously growing amount of resources within the embedded systems to provide additional co

    39、mputational power, transmission bandwidth or memory capacities. The interconnection structures between processing nodes, sensors and actors are becoming more and more complex. A mixture of wire-based transmission protocols and wireless systems might form a highly inhomogeneous network structure with

    40、 high bandwidths to satisfy the customers demands. Another trend is the ongoing evolution of computational resources. Efficient Reliability and Safety Analysis for Mixed- Criticality Embedded Systems 2011-01-0445 Published 04/12/2011 Maurice Sebastian, Philip Axer and Rolf Ernst Technische Universit

    41、t Braunschweig Nico Feiertag and Marek Jersak Symtavision Gmbh Copyright 2011 SAE International doi:10.4271/2011-01-0445 P151383_PT-174.indb 3 11/13/15 2:35 PM4 Future processor cores must be able to provide sufficient processing capacities while energy consumption should be minimized. For that purp

    42、ose the appliance of highly integrated multi-cores seems to be a promising approach. Even though these design approaches might be considered as a quite suitable solution to handle the upcoming challenges, the issue of reliability is gaining more and more importance in that context. Inhomogeneous hig

    43、h-bandwidth networks, unpredictable EMC effects, shrinking of semiconductor devices or decreasing supply voltages cause the probability of transient errors to increase drastically. Consequently the individual system components must be hardened such that they are able to tolerate faults and to ensure

    44、 correct service behaviour. For that purpose numerous fault tolerance mechanisms such as modular redundancy, forward error correction, cyclic redundancy checks or checkpointing/ rollback schemes have been suggested in the past. Even though these mechanisms are able to detect errors and to react in a

    45、n appropriate, they induce a certain amount of temporal overhead. This overhead is normally acceptable for general purpose systems because these systems are not subjected to hard real-time constraints. However in embedded systems and especially in the automotive sector the latency of system function

    46、s matters. Deadlines are given such that each deadline miss actually violates the system specification and thus produces a failure which potentially causes severe causalities. In particular this topic is relevant when safety-critical systems are considered. These systems must be certified based on s

    47、tate-of-the art safety standards such as IEC 61508 or ISO 26262. Most safety standards use a risk based approach to identify safety functions and potential risk that emanate from it. If the risk is unacceptably high, it is necessary to reduce the risk. A common approach to quantify this risk reducti

    48、on is to use target failure rates. Depending on the degree of risk reduction that is required to fulfill the requirement of a specific safety function, different constraints for the target failure rate and thus for the required degree of reliability are given. For example, IEC 61508 specifies four s

    49、afety integrity levels (SIL), each associated with a maximum acceptable failure rate. ISO 26262 is an adaptation of IEC 61508 for the automotive domain that introduces a similar notation, referred to as automotive SIL (ASIL). To verify that the system fulfills these reliability requirements, suitable analytical methods such as formal analysis, simulation or testing are necessary to proof the actually achieved SIL or ASIL. For that purpose simulation approac


    注意事项

    本文(SAE PT-174-2015 Design and the Reliability Factor (To Purchase Call 1-800-854-7179 USA Canada or 303-397-7956 Worldwide).pdf)为本站会员(赵齐羽)主动上传,麦多课文档分享仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文档分享(点击联系客服),我们立即给予删除!




    关于我们 - 网站声明 - 网站地图 - 资源地图 - 友情链接 - 网站客服 - 联系我们

    copyright@ 2008-2019 麦多课文库(www.mydoc123.com)网站版权所有
    备案/许可证编号:苏ICP备17064731号-1 

    收起
    展开